Related papers: Emissivity measurements with an Atomic Force Micro…
We present a mechanical cantilever-based tabletop interferometer to measure the radiation force exerted by light. Using a high-power (~ 1W) pulsed laser beam, we excite mechanical oscillations in a thin metallic cantilever. The cantilever…
Heat transport in low-dimensional solids can significantly differ from their bulk counterpart due to various size-related effects. This offers rich heat transport phenomena to emerge. However, finding an appropriate thermometry method for…
A method to measure the viscosity of liquids at microscales is presented. It uses a thin glass fiber fixed on the tip of the cantilever of an extremely low noise Atomic Force Microscope (AFM), which accurately measures the cantilever…
Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…
We consider the matterwave interferometric measurement of atomic velocities, which forms a building block for all matterwave inertial measurements. A theoretical analysis, addressing both the laboratory and atomic frames and accounting for…
Thermal expansion, or dilation, is closely related to the specific heat, and provides useful information regarding material properties. The accurate measurement of dilation in confined spaces coupled with other limiting experimental…
In this study, we investigated Rydberg atom-based microwave electrometry using polarization spectroscopy in a room-temperature vapor cell. By measuring Autler-Townes splitting in the electromagnetically induced transparency (EIT) spectrum,…
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
In the described device, the thermal emissivity or absorptivity of the sample is measured by substitution of the radiative heat flow between two parallel surfaces by thermal output of a heater. Fast measurements of the mutual emissivity for…
Rydberg atom-based electrometry enables traceable electric field measurements with high sensitivity over a large frequency range, from gigahertz to terahertz. Such measurements are particularly useful for the calibration of radio frequency…
Rydberg-atom electrometry enables highly sensitive electric-field measurements by exploiting the extreme polarizability of Rydberg states in alkali atoms. Millimeter-scale atomic vapor cells can be accurately and economically…
Photo-induced forces can be used to manipulate and cool the mechanical motion of oscillators. When the oscillator is used as a force sensor, such as in atomic force microscopy, active feedback is an enticing route to enhancing measurement…
A technique to measure microscopic rotational motion is presented. When a small fluorescent polystyrene microsphere is attached to a larger polystyrene microsphere, the larger sphere acts as a lens for the smaller microsphere and provides…
The force exerted on nanoparticles and atomic clusters by fast passing electrons like those employed in transmission electron microscopes are calculated and integrated over time to yield the momentum transferred from the electrons to the…
The force exerted on nanoparticles and atomic clusters by fast passing electrons like those employed in transmission electron microscopes are calculated and integrated over time to yield the momentum transferred from the electrons to the…
Mitigating the far sidelobes of a wide field-of-view telescope is one of the critical issues for polarization observation of the cosmic microwave background. Since even small reflections of stray light at the millimeter-wave absorbers…
The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…
Optical tweezers are widely used as a highly sensitive tool to measure forces on micron-scale particles. One such application is the measurement of the electric charge of a particle, which can be done with high precision in liquids, air, or…
Energy exchanges due to chemical reactions between a silicon surface and a SF6 plasma were directly measured using a heat flux microsensor (HFM). The energy flux evolution was compared with those obtained when only few reactions occur at…
Milli-Kelvin atomic force microscopy (mK-AFM) presents an ongoing experimental challenge due to the intense vibrations in a cryogen-free dilution refrigerator and the low cooling power available at mK temperatures. A viable approach is to…