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The time evolution of the electron density and the resulting time dependence of X-ray diffraction peak intensity in a crystal irradiated by highly intense femtosecond pulses of an XFEL is investigated theoretically on the basis of rate…

Atomic Physics · Physics 2013-11-26 A. Leonov , D. Ksenzov , A. Benediktovitch , I. Feranchuk , U. Pietsch

Determining crystal structures from X-ray diffraction data is fundamental across diverse scientific fields, yet remains a significant challenge when data is limited to low resolution. While recent deep learning models have made…

Materials Science · Physics 2025-10-22 Jiale Zhao , Cong Liu , Yuxuan Zhang , Chengyue Gong , Zhenyi Zhang , Shifeng Jin , Zhenyu Liu

Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution…

Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems,…

Instrumentation and Detectors · Physics 2025-10-20 Stephanie M. Ribet , Rohan Dhall , Colin Ophus , Karen C. Bustillo

Synthesizing realistic and spatially precise anomalies is essential for enhancing the robustness of industrial anomaly detection systems. While recent diffusion-based methods have demonstrated strong capabilities in modeling complex defect…

Computer Vision and Pattern Recognition · Computer Science 2025-12-01 Yanshu Wang , Xichen Xu , Xiaoning Lei , Guoyang Xie

With the rapid development of short-pulse intense laser sources, studies of matter under extreme irradiation conditions enter further unexplored regimes. In addition, an application of X-ray Free- Electron Lasers (XFELs), delivering intense…

This paper aims to address the unsupervised video anomaly detection (VAD) problem, which involves classifying each frame in a video as normal or abnormal, without any access to labels. To accomplish this, the proposed method employs…

Computer Vision and Pattern Recognition · Computer Science 2023-07-20 Anil Osman Tur , Nicola Dall'Asen , Cigdem Beyan , Elisa Ricci

The use of coherent x-ray beams has been greatly developing for the past decades. They are now used by a wide scientific community to study biological materials, phase transitions in crystalline materials, soft matter, magnetism, strained…

Materials Science · Physics 2010-09-01 V. L. R. Jacques , S. Ravy , D. Le Bolloc'h , E. Pinsolle , M. Sauvage-Simkin , F. Livet

Well-known Kato's theory of the Laue diffraction of spherical x-ray waves is generalized to the case of the neutron diffraction in strongly absorbing crystals, taking into consideration both the potential and the resonant scattering of…

Materials Science · Physics 2019-06-26 A. Ya. Dzyublik , V. V. Mykhaylovskyy , V. Yu. Spivak

The contribution of static and thermal disorder is one of the largest challenges for the accurate determination of the atomic structure from the extended X-ray absorption fine structure (EXAFS). Although there are a number of generally…

Materials Science · Physics 2020-06-25 A. Kuzmin , J. Timoshenko , A. Kalinko , I. Jonane , A. Anspoks

Metasurfaces have attracted extensive interests due to their ability to locally manipulate optical parameters of light and easy integration to complex optical systems. Particularly, metasurfaces can provide a novel platform for splitting…

We propose a method for realizing true, real-space imaging of charge dynamics in a periodic system, with angstrom spatial resolution and attosecond time resolution. In this method, inelastic x-ray scattering (IXS) is carried out with a…

Strongly Correlated Electrons · Physics 2015-06-05 Yu Gan , Anshul Kogar , Peter Abbamonte

Grazing incidence X-ray diffraction (GIXD) is widely used for the structural characterization of thin films, particularly for analyzing phase composition and the orientation distribution of crystallites. While various tools exist for…

Photoelectron Angular Distributions (PADs) resulting from 800 nm and 1300 nm strong field ionization of impulsively aligned CF$_3$I molecules were analyzed using time-dependent density functional theory (TDDFT). The normalized difference…

The objective of this article is to study the behavior of electromagnetic field under X-ray diffraction by time-dependent deformed crystals. Derived system of differential equations looks like the Takagi equations in the case of…

Computational Physics · Physics 2007-05-23 Svetlana Sytova

The structural complexity and instability of many interference phase microscopy methods are the major obstacles toward high-precision phase measurement. In this vein, improving more efficient configurations as well as proposing new methods…

Optics · Physics 2020-01-08 Samira Ebrahimi , Masoomeh Dashtdar

The core theme of X-ray crystallography is reconstructing the electron density distribution of crystals under the constraints of observed diffraction data. Nevertheless, the reconstruction of electron density distribution by straightforward…

Materials Science · Physics 2015-07-14 Hui Li , Meng He , Ze Zhang

Accreting black holes show characteristic reflection features in their X-ray spectrum, including an iron K$\alpha$ line, resulting from hard X-ray continuum photons illuminating the accretion disk. The reverberation lag resulting from the…

High Energy Astrophysical Phenomena · Physics 2018-01-24 Guglielmo Mastroserio , Adam Ingram , Michiel van der Klis

We propose to use the self-seeding scheme with single crystal monochromator at the European X-ray FEL to produce monochromatic, high-power radiation at 16 keV. Based on start to end simulations we show that the FEL power of the…

Accelerator Physics · Physics 2011-11-28 Gianluca Geloni , Vitali Kocharyan , Evgeni Saldin

A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…

Materials Science · Physics 2011-05-17 V. P. Kalinushkin , V. A. Yuryev , O. V. Astafiev