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Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the…

Instrumentation and Detectors · Physics 2014-02-24 M. Schneiderbauer , F. J. Giessibl

The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…

Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…

Mesoscale and Nanoscale Physics · Physics 2023-08-01 Alba R. Piacenti , Casey Adam , Nicholas Hawkins , Ryan Wagner , Jacob Seifert , Yukinori Taniguchi , Roger Proksch , Sonia Contera

Nonlinear magnetoelectric effect(NME) in alkali atomic vapor has applications in precision magnetometry in the radio-frequency domain. We report the application of the NME in alkali atomic vapors for projective measurement of…

Atomic Physics · Physics 2024-08-21 Sujit Garain , Surya Narayan Sahoo , Ashok K Mohapatra

Dynamic properties of NiFe thin films on PMN-PT piezoelectric substrate are investigated using the spin-diode method. Ferromagnetic resonance (FMR) spectra of microstrips with varying width are measured as a function of magnetic field and…

When probing nuclear spins in materials on the nanometer scale, random fluctuations of the spin polarization will exceed the mean Boltzmann polarization for sample volumes below about (100nm)^3. In this work, we use magnetic resonance force…

Mesoscale and Nanoscale Physics · Physics 2008-01-14 C. L. Degen , M. Poggio , H. J. Mamin , D. Rugar

The extensive research and development of micromechanical resonators is trying to allow the use of these devices for highly sensitive applications. Microcantilevers are some of the simplest MEMS structure and had been proved to be a good…

Other Computer Science · Computer Science 2008-02-22 M. Narducci , E. Figueras , I. Gracia , L. Fonseca , J. Santander , C. Cané

We demonstrate a detection method for microwave spectroscopy on magnetization reversal dynamics of nanomagnets. Measurement of the nanomagnet anisotropic magnetoresistance was used for probing how magnetization reversal is resonantly…

Materials Science · Physics 2009-11-11 J. Grollier , M. V. Costache , C. H. van der Wal , B. J. van Wees

Nowadays, silicon micro-cantilevers with different geometrical shapes are widely used as micro-electro-mechanical systems and, more recently, as force sensor probes in atomic force microscopy (AFM). During the last ten years, several…

Classical Physics · Physics 2009-04-28 Guy Louarn , Stéphane Cuenot

The field of nanoscale magnetic resonance imaging (NanoMRI) was started 30 years ago. It was motivated by the desire to image single molecules and molecular assemblies, such as proteins and virus particles, with near-atomic spatial…

Magnetic torque is used to actuate nano-torsional resonators, which are fabricated by focused-ion-beam milling of permalloy coated silicon nitride membranes. Optical interferometry is used to measure the mechanical response of two torsion…

Mesoscale and Nanoscale Physics · Physics 2010-03-09 J. P. Davis , D. Vick , D. C. Fortin , J. A. J. Burgess , W. K. Hiebert , M. R. Freeman

We present the first spectropolarimetric radio observations that apply Rotation Measure (RM) Synthesis to interferometric data from the Giant Metrewave Radio Telescope (GMRT) at 610 MHz. Spectropolarimetry requires measurement of a large…

Instrumentation and Methods for Astrophysics · Physics 2013-09-19 J. S. Farnes , D. A. Green , N. G. Kantharia

This report describes a cantilever controller for magnetic resonance force microscopy (MRFM) based on a field programmable gate array (FPGA), along with the hardware and software used to integrate the controller into an experiment. The…

Instrumentation and Detectors · Physics 2009-02-12 Jonathan P. Jacky , Joseph L. Garbini , Matthew Ettus , John A. Sidles

The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample interaction for the NSMM. We observe that this length scale plays…

Materials Science · Physics 2007-05-23 Atif Imtiaz , Marc Pollak , Steven M Anlage , John D Barry , John Melngailis

We demonstrate the use of the magnetic-field-dependence of highly spatially confined, GHz-frequency ferromagnetic resonances in a ferromagnetic nanostructure for the detection of adsorbed magnetic nanoparticles. This is achieved in a large…

We use a scanning nanometer-scale superconducting quantum interference device to map the stray magnetic field produced by individual ferromagnetic nanotubes (FNTs) as a function of applied magnetic field. The images are taken as each FNT is…

We present an alternative switching-magnetization magnetic force microscopy (SM- MFM) method using planar tip-on-chip probes. Unlike traditional needle-like tips, the planar probe approach integrates a microdevice near the tip apex with…

The study of magnetars is of particular relevance since these objects are the only laboratories where the physics in ultra-strong magnetic fields can be directly tested. Until now, spectroscopic and timing measurements at X-ray energies in…

High Energy Astrophysical Phenomena · Physics 2015-06-18 Roberto Taverna , Fabio Muleri , Roberto Turolla , Paolo Soffitta , Sergio Fabiani , Luciano Nobili

We consider a simple version of a cyclic adiabatic inversion (CAI) technique in magnetic resonance force microscopy (MRFM). We study the problem: What component of the spin is measured in the CAI MRFM? We show that the non-destructive…

Quantum Physics · Physics 2009-11-07 G. P. Berman , F. Borgonovi , H. S. Goan , S. A. Gurvitz , V. I. Tsifrinovich

We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…

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