Related papers: X-ray Near Field Speckle: Implementation and Criti…
The GALAXIES beamline at the SOLEIL synchrotron is dedicated to inelastic x-ray scattering (IXS) and photoelectron spectroscopy (HAXPES) in the 2.3-12 keV hard x-ray range. These two techniques offer powerful, complementary methods of…
We demonstrate the potential of X-ray free-electron lasers (XFEL) to advancethe understanding of complex plasma dynamics by allowing for the first time nanometer and femtosecond resolution at the same time in plasma diagnostics. Plasma…
In the framework of research on IVth generation reactors and high intensity neutron sources a low-power prototype neutron amplifier was recently proposed by INFN. It is based on a low-energy, high current proton cyclotron, whose beam,…
Laser speckle, the granular intensity pattern arising from random optical interference, provides a high-dimensional encoding of spectral information that can be exploited for precision metrology. Speckle-based spectrometers have advanced…
Sensitive to scattering from unresolved sample structures, the dark-field channel in full-field X-ray imaging provides complementary information to that offered by conventional attenuation and phase-contrast methods. A range of experimental…
We present a new technique for monitoring microlensing activity even in highly crowded fields, and use this technique to place limits on low-mass MACHOs in the haloes of M31 and the Galaxy. Unlike present Galactic microlensing surveys, we…
In a recent article (P.Wochner et al., PNAS (2009)) x-ray scattering intensity correlations around a ring, in the speckle diffraction pattern of a colloidal glass, were shown to display a remarkable ~ cos(n $\phi$) dependence on the angular…
We design and characterize a novel axilens-based diffractive optics platform that flexibly combines efficient point focusing and grating selectivity and is compatible with scalable top-down fabrication based on a 4-level phase mask…
The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next generation integrated electronic circuits. Modern transistor architectures for e.g. FinFETs…
Slitless (or wide field) imaging spectroscopy provides simultaneous imaging and spectral information from a wide field of view, which allows for rapid spectroscopic data collection of extended sources. Depending on the size of the extended…
Flux-resolved X-ray spectroscopy is widely adopted to investigate the spectral variation of a target between various flux levels. In many cases it is done through horizontally splitting a single light curve into multiple flux levels with…
Compared to single-source imaging systems, dual-source imaging systems equipped with two cross-distributed scanning beams significantly enhance temporal resolution and capture more comprehensive object scanning information. Nevertheless,…
We investigate the uncertainties of fitted X-ray model parameters and fluxes for relatively faint Chandra ACIS-I source spectra. Monte-Carlo (MC) simulations are employed to construct a large set of 150,000 fake X-ray spectra in the low…
As photon counting detectors are being explored for medical and industrial imaging applications, there is a critical need to understand spectral characteristics of scattered x-ray photons. Scattered radiation is detrimental to x-ray imaging…
We aim to study the variability properties of bright hard X-ray selected Active Galactic Nuclei (AGN) with redshift between 0.3 and 1.6 detected in the Chandra Deep Field South (XMM-CDFS) by a long XMM observation. Taking advantage of the…
This paper presents the analysis of a statistically complete sample of 28 serendipitous X-ray sources selected in 82 pointed XMM-Newton fields down to a count-rate of 0.002 counts s^-1(4.5-7.5 keV energy band). This is the first sample…
We investigate the nature of the faint X-ray source population through X-ray spectroscopy and variability analyses of 136 AGN detected in the 2 Ms Chandra Deep Field-North survey with > 200 background-subtracted 0.5-8.0 keV counts…
We analyze theoretically the resonant inelastic x-ray scattering (RIXS) at the Ni K edge in the stripe-ordered state of La_{2-x}Sr_xNiO_4 at x=1/3. In the calculation of RIXS spectra, the stripe-ordered ground state is described within the…
Photon-based spectroscopies have had a significant impact on both fundamental science and applications by providing an efficient approach to investigate the microscopic physics of materials. Together with the development of synchrotron…
Extended X-ray emission can be studied either spatially (through its surface brightness profile) or spectrally (by analyzing the spectrum at various locations in the field). Both techniques have advantages and disadvantages, and when the…