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Related papers: Far-Field Microscopy of Sparse Subwavelength Objec…

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We present the experimental reconstruction of sub-wavelength features from the far-field intensity of sparse optical objects: sparsity-based sub-wavelength imaging combined with phase-retrieval. As examples, we demonstrate the recovery of…

We use compressed sensing to demonstrate theoretically the reconstruction of sub-wavelength features from measured far-field, and provide experimental proof-of-concept. The methods can be applied to non-optical microscopes, provided the…

Optics · Physics 2015-05-14 Snir Gazit , Alexander Szameit , Yonina C. Eldar , Mordechai Segev

Information about microscopic objects with features smaller than the diffraction limit is almost entirely lost in a far-field diffraction image but could be partly recovered with data completition techniques. Any such approach critically…

Optics · Physics 2020-11-17 Maria Bancerek , Krzysztof M. Czajkowski , Rafal Kotynski

A new principle of subwavelength imaging based on frequency scanning is considered. It is shown that it is possible to reconstruct the spatial profile of an external field exciting an array (or coupled arrays) of subwavelength-sized…

Optics · Physics 2008-06-27 Stanislav Maslovski , Pekka Alitalo , Sergei Tretyakov

Improvement of label-free far-field resolution of optical imaging is possible with prior knowledge of the object such as its sparsity or accumulated by a posteriori examination of a similar class of object1-4. We show that the sole…

Optics · Physics 2026-02-03 Taeyong Chang , Giorgio Adamo , Nikolay I. Zheludev

We present an imaging technique that allows the recovery of the transparency profile of wavelength-scale objects with deep subwavelength resolution based on far-field intensity measurements. The approach, interscale mixing microscopy (IMM),…

Optics · Physics 2017-03-21 Sandeep Inampudi , Nicholas Kuhta , Viktor A. Podolskiy

We report the experimental demonstration of deeply subwavelength far-field optical imaging of unlabelled samples with resolution better than $\lambda/20$. We beat the ~$\lambda$/2 diffraction limit of conventional optical microscopy several…

Optics · Physics 2020-01-07 Tanchao Pu , Jun-Yu Ou , Nikitas Papasimakis , Nikolay I. Zheludev

Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…

We present a fast and accurate method for dense depth reconstruction from sparsely sampled light fields obtained using a synchronized camera array. In our method, the source images are over-segmented into non-overlapping compact superpixels…

Image and Video Processing · Electrical Eng. & Systems 2018-12-18 Aleksandra Chuchvara , Attila Barsi , Atanas Gotchev

The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern super-resolution microscopy techniques employ active interaction with the object by exploiting its optical…

Optics · Physics 2022-01-05 A. A. Pushkina , G. Maltese , J. I. Costa-Filho , P. Patel , A. I. Lvovsky

Diffraction limit is manifested in the loss of high spatial frequency information that results from decay of evanescent waves. As a result, conventional far-field optics yields no information about an object's subwavelength features. Here…

Optics · Physics 2012-01-24 Leonid Alekseyev , Evgenii Narimanov , Jacob Khurgin

Paradoxically, imaging with resolution much below the wavelength $\lambda$ - now common place in the visible spectrum - remains challenging at lower frequencies, where arguably it is needed most due to the large wavelengths used. Techniques…

Optics · Physics 2023-12-12 Alessandro Tuniz , Boris T. Kuhlmey

We present an analytical description and an experimental realization of interscale mixing microscopy, a diffraction-based imaging technique that is capable of detecting wavelength/10 objects in far-field measurements with both coherent and…

Spatial resolution of most imaging devices is fundamentally restricted by diffraction. This limitation is manifested in the loss of high spatial frequency information contained in evanescent waves. As a result, conventional far-field optics…

Optics · Physics 2010-03-16 Leonid Alekseyev , Evgenii Narimanov , Jacob Khurgin

Seeing and recognizing an object whose size is much smaller than the illumination wavelength is a challenging task for an observer placed in the far field, due to the diffraction limit. Recent advances in near and far field microscopy have…

Applied Physics · Physics 2020-08-19 Bakhtiyar Orazbayev , Romain Fleury

This paper is concerned with the inverse problem of reconstructing a small object from far field measurements. The inverse problem is severally ill-posed because of the diffraction limit and low signal to noise ratio. We propose a novel…

Analysis of PDEs · Mathematics 2017-04-18 Habib Ammari , Matias Ruiz , Sanghyeon Yu , Hai Zhang

Recently it was reported that deeply subwavelength features of free space superoscillatory electromagnetic fields can be observed experimentally and used in optical metrology with nanoscale resolution [Science 364, 771 (2019)]. Here we…

Optics · Physics 2019-10-08 T. Pu , V. Savinov , G. Yuan , N. Papasimakis , N. I. Zheludev

Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light {\lambda}. However, metrology of subwavelength objects was deemed impossible…

We demonstrate that sub-wavelength optical images borne on partially-spatially-incoherent light can be recovered, from their far-field or from the blurred image, given the prior knowledge that the image is sparse, and only that. The…

Information Theory · Computer Science 2015-05-27 Yoav Shechtman , Yonina C. Eldar , Alexander Szameit , Mordechai Segev

The resolution of far-field optical microscopes, which rely on propagating optical modes, is widely believed to be limited because of diffraction to a value on the order of a half-wavelength $\lambda /2$ of the light used. Although…

Materials Science · Physics 2009-11-10 Igor I. Smolyaninov , Christopher C. Davis , Jill Elliott , Anatoly V. Zayats
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