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Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…
Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…
Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different…
Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…
We report a systematic study to determine local elastic properties of surfaces combining atomic force microscope (AFM) with acoustic waves which is known as atomic force acoustic microscopy - AFAM. We describe the methodology of AFAM in…
Miniaturized mechanical resonators have proven to be excellent force sensors. However, they usually rely on resonant sensing schemes, and their excellent performance cannot be utilized for the detection of static forces. Here, we report on…
Real time combination of nanosensors and nanoactuators with virtual reality environment and multisensorial interfaces enable us to efficiently act and perceive at nanoscale. Advanced manipulation of nanoobjects and new strategies for…
We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…
Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…
The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…
While tremendous advances in visual and auditory realism have been made for virtual and augmented reality (VR/AR), introducing a plausible sense of physicality into the virtual world remains challenging. Closing the gap between real-world…
We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resonance frequency of the probe…
Atomic force microscopy (AFM) phase approach-curves have significant potential for nanoscale material characterization, however, the availability of robust datasets and automated analysis tools has been limited. In this paper, we introduce…