Related papers: Dynamics of quartz tuning fork force sensors used …
Piezoelectric quartz tuning forks have been employed as the force sensor in a dynamic mode scanning force microscope operating at temperatures down to 1.7 K at He-gas pressures of typically 5 mbar. An electrochemically etched tungsten tip…
Determining sensor parameters is a prerequisite for quantitative force measurement. Here we report a direct, high-precision calibration method for quartz tuning fork(TF) sensors that are popular in the feld of nanomechanical measurement. In…
We use a piezoelectric quartz tuning fork to calibrate the displacement of ceramic piezoelectric scanners which are widely employed in scanning probe microscopy. We measure the static piezoelectric response of a quartz tuning fork and find…
Quartz tuning forks are high-quality mechanical oscillators widely used in low temperature physics as viscometers, thermometers and pressure sensors. We demonstrate that a fork placed in liquid helium near the surface of solid helium is…
Piezoelectric quartz tuning forks are investigated in view of their use as force sensors in dynamic mode scanning probe microscopy at temperatures down to 1.5 K and in magnetic fields up to 8 T. The mechanical properties of the forks are…
The implementation of a tuning fork sensor in a scanning force microscope operational at 300 mK is described and the harmonic oscillator model of the sensor is motivated. These sensors exhibit very high quality factors at low temperatures.…
We have studied the dynamics of quartz tuning fork resonators used in atomic force microscopy taking into account mechanical energy dissipation through the attachment of the tuning fork base. We find that the tuning fork resonator quality…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…
Immersed mechanical resonators are well suited for probing the properties of fluids, since the surrounding environment influences the resonant characteristics of such oscillators in several ways. Quartz tuning forks have gained much…
The novel application of a piezoelectric quartz resonator for the detection of trapped ions has developed in the observation of the quartz-ions interaction under non-equilibrium conditions, opening new perspectives for high-sensitive…
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to…
We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically…
We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…
Coupled oscillators are among the simplest composite quantum systems in which the interplay of entanglement and interaction may be explored. We examine the effects of coupling on fluctuations of the coordinates and momenta of the…
Commercial quartz oscillators of the tuning-fork type with a resonant frequency of ~32 kHz have been investigated in helium liquids. The oscillators are found to have at best Q values in the range 10^5-10^6, when measured in vacuum below…
We report the fabrication and the characterization of carbon fibre tips for their use in combined scanning tunnelling and force microscopy based on piezoelectric quartz tuning fork force sensors. We find that the use of carbon fibre tips…
Higher harmonic modes in nanoscale silicon cantilevers and microscale quartz tuning forks are detected and characterized using a custom scanning optical homodyne interferometer. Capable of both mass and force sensing, these resonators…
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…
We study the entanglement dynamics of a system consisting of a large number of coupled harmonic oscillators in various configurations and for different types of nearest neighbour interactions. For a one-dimensional chain we provide compact…
A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring…