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Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…

Applied Physics · Physics 2018-09-06 Omur E. Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Peter Grutter

We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…

Chemical Physics · Physics 2016-09-28 Yuval Ebenstein , Eyal Yoskovitz , Ronny Costi , Asaf Aharoni , Uri Banin

Atomic force microscopy is an important tool for characterizing surface acoustic waves, in particular for high frequencies, where the wavelength is too short to be resolved by laser interferometry. A caveat is, that the cantilever…

Mesoscale and Nanoscale Physics · Physics 2022-09-29 Jan Hellemann , Filipp Müller , Madeleine Msall , Paulo V. Santos , Stefan Ludwig

We present a novel technique for determining the microscale AC susceptibility of magnetic materials. We use magnetic field sensing properties of nitrogen-vacancy (\ce{NV-}) centers in diamond to gather quantitative data about the magnetic…

Applied Physics · Physics 2023-05-17 Shishir Dasika , Madhur Parashar , Kasturi Saha

Miniaturized mechanical resonators have proven to be excellent force sensors. However, they usually rely on resonant sensing schemes, and their excellent performance cannot be utilized for the detection of static forces. Here, we report on…

Instrumentation and Detectors · Physics 2018-08-15 Erik Hebestreit , Martin Frimmer , René Reimann , Lukas Novotny

In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions…

Materials Science · Physics 2016-08-14 F. Johann , Á. Hoffmann , E. Soergel

Advances in intensity-based microscopy techniques have improved our ability to quantify particle motion at microscopic scales, enabling insight into diffusion and collective dynamics. Building on this foundation, we introduce a novel…

Soft Condensed Matter · Physics 2026-04-03 Sophie Hermann , Seyed Saman Banarooei , Adam Carter , Carlos A. Silvera Batista , Sophie Marbach

We measure the local contact forces at both the top and bottom boundaries of three-dimensional face-centered-cubic and hexagonal-close-packed granular crystals in response to an external force applied to a small area at the top surface.…

Soft Condensed Matter · Physics 2009-11-07 Nathan W. Mueggenburg , Heinrich M. Jaeger , Sidney R. Nagel

Nanoscale forces play an important role in different scanning probe microscopies, most notably atomic force microscopy (AFM). In contrast, in scanning near-field optical microscopy (SNOM) a light-induced coupled local optical polarization…

Mesoscale and Nanoscale Physics · Physics 2015-08-27 Honghua U. Yang , Markus B. Raschke

A detailed investigation of the structural and vibrational properties of various prestressed silicon nitride membranes patterned with one-dimensional photonic crystal structures is presented. The tensile stress-related deformation of the…

Applied Physics · Physics 2022-05-20 Ali A. Darki , Robin V. Nielsen , Jens V. Nygaard , Aurélien Dantan

A new approach for characterizing the dislocation microstructure obtained from atomistic simulations is introduced, which relies on converting properties of discrete lines to continuous data. This data is represented by a number of density…

The effect of etching time scale of glass surface on its statistical properties has been studied using atomic force microscopy technique. We have characterized the complexity of the height fluctuation of a etched surface by the stochastic…

Data Analysis, Statistics and Probability · Physics 2015-05-13 G. R. Jafari , M. Reza Rahimi Tabar , A. Iraji zad , G. Kavei

Pressure alters the physical, chemical and electronic properties of matter. The development of the diamond anvil cell (DAC) enables tabletop experiments to investigate a diverse landscape of high-pressure phenomena ranging from the…

An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…

Applications · Statistics 2017-06-28 Bryan Yates , Aleksander Labuda , Martin Lysy

Intercalation of two dimensional materials, particularly transition metal dichalcogenides, is a noninvasive way to modify electronic, optical and structural properties of these materials. However, research of these atomic-scale phenomena…

Molecular dynamics simulations have been performed to understand true atomic resolution, which has been observed on the Si(111)-7$\times$7 surface by dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale contrast is…

Materials Science · Physics 2009-10-31 Abduxukur Abdurixit , Alexis Baratoff , Ernest Meyer

For Minimally Invasive Surgical (MIS) robots, accurate haptic interaction force feedback is essential for ensuring the safety of interacting with soft tissue. However, most existing MIS robotic systems cannot facilitate direct measurement…

Robotics · Computer Science 2025-01-16 Jiayin Wang , Mingfeng Yao , Yanran Wei , Xiaoyu Guo , Ayong Zheng , Weidong Zhao

Tip enhanced IR spectra and imaging have been widely used in cutting-edge studies for the in-depth understanding of the composition, structure and function of interfaces at the nanoscale. However, molecular monolayer sensitivity has only…

Shock compression plate impact experiments conventionally rely on point-wise velocimetry measurements based on laser-based interferometric techniques. This study presents an experimental methodology to measure the free surface full-field…

Applied Physics · Physics 2023-03-08 Suraj Ravindran , Vatsa Gandhi , Akshay Joshi , Guruswami Ravichandran

Diffraction-based stress analysis of textured materials depends on understanding their elastic heterogeneity and its influence on microscopic strain distributions, which is generally done by using simplifying assumptions for crystallite…

Materials Science · Physics 2025-05-23 Maximilian Krause , Nicola Simon , Claudius Klein , Jens Gibmeier , Thomas Böhlke
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