Related papers: Phase imaging with intermodulation atomic force mi…
Phase imaging techniques extract the optical path-length information of a scene, whereas wavefront sensors provide the shape of an optical wavefront. Since these two applications have different technical requirements, they have developed…
Accelerator mass spectrometry (AMS) is a widely-used technique with multiple applications, including geology, molecular biology and archeology. In order to achieve a high dynamic range, AMS requires tandem accelerators and large magnets,…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
Multi-Modal Image Fusion (MMIF) aims to combine images from different modalities to produce fused images, retaining texture details and preserving significant information. Recently, some MMIF methods incorporate frequency domain information…
Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…
We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force…
Atomic Force Microscopy (AFM) operating in the frequency modulation mode with a metal tip functionalized with a CO molecule images the internal structure of molecules with an unprecedented resolution. The interpretation of these images is…
Atomic force microscopes have proved to be fundamental research tools in many situations where a gentle imaging process is required, and in a variety of environmental conditions, such as the study of biological samples. Among the possible…
We experimentally investigated the contrast mechanism of infrared photoinduced force microscopy (PiFM) for recording vibrational resonances. Extensive experiments have demonstrated that spectroscopic contrast in PiFM is mediated by…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising from system noise, a deep understanding of MDF is essential…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…
The interaction of Na atoms with a surface was probed by inserting a nanofabricated material grating into one arm of an atom interferometer (IFM). This technique permits a direct measurement of the change in phase and coherence of matter…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial…
Time-domain interferometry is an important principle in Fourier transform (FT) and nonlinear femto- to attosecond spectroscopy. To optimize the resolution and sensitivity of this approach, various interferometer stabilization schemes have…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated with the third degree polynomial. The effect of some…
The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…