Related papers: High resolution miniature dilatometer based on AFM…
We report on the development of a sensitive dilatometer based upon a AFM piezocantilever. This dilatometer has been tested at temperatures down to 25 mK and in magnetic fields up to 16 T. The layered heavy fermion superconductor $CeCoIn_5$…
We report a new design of temperature-modulated dilatometer, which obtains the linear thermal expansion coefficient by measuring the oscillating changes of the sample's length and temperature by a piezobender and a thermocouple,…
We describe the design, construction, calibration, and operation of a relatively simple differential capacitive dilatometer suitable for measurements of thermal expansion and magnetostriction from 300 K to below 1 K with a low-temperature…
Thermal expansion and magnetostriction are directional dependent thermodynamic quantities. For the characterization of novel quantum phases of matter it is required to study materials under multi-extreme conditions, in particular down to…
We introduce a high performance differential dilatometer based on an all-fiber Michelson interferometer at cryogenic temperature with $10^{-10}$ resolution in $\delta L/L$. It resolve the linear thermal expansion coefficient by measuring…
An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The…
We report on the realization of a capacitive dilatometer, designed for high-resolution measurements of length changes of a material for temperatures 1.4 K $\leq T \leq$ 300 K and hydrostatic pressure $P \leq$ 250 MPa. Helium ($^4$He) is…
We demonstrate AFM imaging with a microcantilever force transducer where an integrated superconducting microwave resonant circuit detects cantilever deflection using the principles of cavity optomechanics. We discuss the detector…
We present a novel application of our high-resolution capacitance dilatometer, specifically engineered for the precise characterization of quantum materials. These materials, which often appear as ultrathin, platelet-shaped crystals, are…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
We report on the design, fabrication, and implementation of ultrasensitive micromechanical oscillators. Our ultrathin single-crystal silicon cantilevers with integrated magnetic structures are the first of their kind: They are fabricated…
An extremely sensitive temperature measurement MEMS device is developed based on the principle of structural deflection in a bi-material cantilever caused by a difference in thermal expansion coefficients. A dual-beam asymmetrical geometry…
The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…
Heat capacity measurements under high pressure places high demands on the calorimeter. Here we describe the development of a miniaturized nanocalorimeter for high-pressure heat capacity measurements at low temperature. The device,…
We present high resolution thermal expansion measurement data obtained with high relative sensitivity of $\Delta$L$/$L = 10$^{-9}$ and accuracy of $\pm$2$\%$ using closed cycle refrigerators employing two different dilatometers. The data…
Atomic force microscopy cantilevers are often, intentionally or not, heated at their extremity. We describe a model to compute the resulting temperature field in the cantilever and in the surrounding fluid on a wide temperature range. In…
High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…
A nanometric needle sensor mounted in an Atomic Force Microscopy allows systematic picometer-range distance measurements. This force sensing device is used in Piezoresponse Force Microscopy (PFM) as a distance sensor, by employing the…
Nowadays, silicon micro-cantilevers with different geometrical shapes are widely used as micro-electro-mechanical systems and, more recently, as force sensor probes in atomic force microscopy (AFM). During the last ten years, several…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…