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We develop a generalized theory for the scattering process produced by interface roughness on charge carriers and which is suitable for any semiconductor heterostructure. By exploiting our experimental insights into the three-dimensional…

The effects of the oxidation atmosphere and crystal faces on the interface-trap density was examined by using constant-capacitance deep-level transient spectroscopy to clarify the origin of them. By comparing the DLTS spectra of the…

SrHfO3 is a potential dielectric material for metal-oxide-semiconductor (MOS) devices. SrHfO3/GaAs interface has attracted attention due to its unique properties. In this paper, the interface properties of (001) SrHfO3/GaAs are investigated…

Materials Science · Physics 2018-02-14 Li-Bin Shi , Xiao-Ming Xiu , Xu-Yang Liu , Kai-Cheng Zhang , Chun-Ran Li , Hai-Kuan Dong

We study the chemical nature of the bonding of an oxide layer to the parent metal. In order to disentangle chemical effects from strain/misfit, Ti(10$\bar{1}$0)/TiO$_{2}$(100) interface has been chosen. We use the density functional…

Materials Science · Physics 2012-12-10 Linggang Zhu , Graeme J. Ackland

We report that annealing in low-oxygen-partial-pressure (low-p$_{\rm O2}$) ambient is effective in reducing the interface state density (D$_{\rm IT}$) at a SiC (0001)/SiO$_{\rm 2}$ interface near the conduction band edge (E$_{\rm C}$) of…

Materials Science · Physics 2019-02-19 Takuma Kobayashi , Keita Tachiki , Koji Ito , Tsunenobu Kimoto

Accurate ab-initio pseudopotential calculations within density functional theory in the LDA approximation have been performed for structural properties and stability of ZnSe/GaAs(001) defected heterostructures. There is a strong…

Materials Science · Physics 2011-12-30 A. Stroppa , M. Peressi

We have investigated the initial growth of Fe on GaAs(110) by means of density functional theory. In contrast to the conventionally used (001)-surface the (110)-surface does not reconstruct. Therefore, a flat interface and small diffusion…

Materials Science · Physics 2009-09-01 A. Grünebohm , H. C. Herper , P. Entel

Biphasic interfaces are complex but fascinating regimes that display a number of properties distinct from those of the bulk. The CO$_2$-H$_2$O interface, in particular, has been the subject of a number of studies on account of its…

Materials Science · Physics 2025-02-13 Samuel G. H. Brookes , Venkat Kapil , Christoph Schran , Angelos Michaelides

We have performed accurate \emph{ab--initio} pseudopotential calculations for the structural and electronic properties of ZnSe/GaAs(001) heterostructures with interface configurations accounting for charge neutrality prescriptions. Beside…

Materials Science · Physics 2011-12-30 A. Stroppa , M. Peressi

Many-body interactions in transition-metal oxides give rise to a wide range of functional properties, such as high-temperature superconductivity, colossal magnetoresistance, or multiferroicity. The seminal recent discovery of a…

The contact resistance between two dissimilar semiconductors is determined by the carrier transmission through their interface. Despite the ubiquitous presence of interfaces, quantitative simulation of charge transport across such…

Mesoscale and Nanoscale Physics · Physics 2022-05-25 Qichen Song , Jiawei Zhou , Gang Chen

We present a tight binding description of electronic properties of the interface between LaAlO$_3$ (LAO) and SrTiO$_3$ (STO). The description assumes LAO and STO perovskites as sets of atomic layers in the $x$-$y$ plane, which are weakly…

Strongly Correlated Electrons · Physics 2016-01-20 V. A. Stephanovich , V. K. Dugaev , J. Barnaś

The structure property of non-ideal Si/GaAs heterostructures that were integrated with the ultra-thin oxide (UO) tunneling interfacial layer has been systematically investigated. Si nanomembranes (NMs) were oxidized in different time…

We report first-principles calculations that reveal the atomic forms, stability, and energy levels of carbon-related defects in SiC (0001)/SiO$_{\rm 2}$ systems. We clarify the stable position (SiC side, SiO$_{\rm 2}$ side, or just at the…

Materials Science · Physics 2019-10-15 Takuma Kobayashi , Yu-ichiro Matsushita

To resolve the microscopic origin of magnetism in the Fe2O3/FeTiO3-system, we have performed density functional theory calculations taking into account on-site Coulomb repulsion. By varying systematically the concentration, distribution and…

Materials Science · Physics 2009-09-23 Rossitza Pentcheva , Hasan Sadat Nabi

The Si/SiO$_2$ interface is populated by isolated trap states which modify its electronic properties. These traps are of critical interest for the development of semiconductor-based quantum sensors and computers, as well as nanoelectronic…

Materials Science · Physics 2024-04-08 Megan Cowie , Taylor J. Z. Stock , Procopios C. Constantinou , Neil Curson , Peter Grütter

Two dimensional electron gases (2DEGs) formed at the interfaces of oxide heterostructures draw considerable interest owing to their unique physics and potential applications. Growing such heterostructures on conventional semiconductors has…

Strongly Correlated Electrons · Physics 2015-06-11 Lior Kornblum , Eric N. Jin , Divine P. Kumah , Alexis T. Ernst , Christine C. Broadbridge , Charles H. Ahn , Fred J. Walker

Thin film synthesis methods developed over the past decades have unlocked emergent interface properties ranging from conductivity to ferroelectricity. However, our attempts to exercise precise control over interfaces are constrained by a…

Materials Science · Physics 2017-11-15 Steven R. Spurgeon , Peter V. Sushko , Ryan B. Comes , Scott A. Chambers

Although two-dimensional (2D) oxide semiconductors exhibit remarkable oxidation resistance compared to conventional 2D materials, the microscopic physical processes that govern this behavior at the atomic scale remains elusive. Using…

Materials Science · Physics 2025-09-03 Xixiang Zhang , Xinmei Yu , Liang Ma , Yanfeng Ge , Yong Liu , Wenhui Wan

The deposition of a thin oxide layer at metal/semiconductor interfaces has been previously reported as a means of reducing contact resistance in 2D electronics. Using X-ray photoelectron spectroscopy with in-situ Ti deposition, we fabricate…

Materials Science · Physics 2019-10-10 Keren M. Freedy , David H. Olson , Patrick E. Hopkins , Stephen J. McDonnell