Related papers: Low-temperature and high magnetic field dynamic sc…
We present the design and performance of a cryogenic scanning tunneling microscope (STM) which operates inside a water-cooled Bitter magnet, which can attain a magnetic field of up to 38 T. Due to the high vibration environment generated by…
The sensitive detection of either static or radio-frequency \textsc{(rf)} magnetic fields is essential to many fundamental studies and applications. Here, we demonstrate the operation of a cold-atom-based, \textsc{rf} magnetometer in…
An AC susceptometer operating in the range of 10 Hz to 100 kHz and at room temperature is designed, built, calibrated and used to characterize the magnetic behaviour of coated magnetic nanoparticles. Other weakly magnetic materials (in…
We present the design of a highly compact High Field Scanning Probe Microscope (HF-SPM) for operation at cryogenic temperatures in an extremely high magnetic field, provided by a water-cooled Bitter magnet able to reach 38 T. The HF-SPM is…
We present a design for a tunneling-current-assisted scanning near-field microwave microscope. For stable operation at cryogenic temperatures, making a small and rigid microwave probe is important. Our coaxial resonator probe has a length…
Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…
Low-temperature scanning probe microscopes (SPMs) are critical for the study of quantum materials and quantum information science. Due to the rising costs of helium, cryogen-free cryostats have become increasingly desirable. However, they…
The characteristic tip_substrate capacitance is crucial for understanding the localized electrical properties in atomic force microscopy (AFM). Since it is highly dependent on tip geometrical features, estimation of the tip_substrate…
Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a…
The activated torsion oscillation magnetometer exploits the mechanical resonance of a cantilever beam, driven by the torque exerted on the sample by an ac field applied perpendicularly to the film plane. We describe a model for the…
We describe the design, construction, and performance of an ultra-low temperature, high-field scanning tunneling microscope (STM) with two independent tips. The STM is mounted on a dilution refrigerator and operates at a base temperature of…
Harnessing the unique properties of non-collinear antiferromagnets (AFMs) will be essential for exploiting the full potential of antiferromagnetic spintronics. Indeed, many of the effects enabling ferromagnetic spintronic devices have a…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
We show that a scanning capacitance microscope (SCM) can image buried delta-doped donor nanostructures fabricated in Si via a recently developed atomic-precision scanning tunneling microscopy (STM) lithography technique. A critical…
We have developed a low-temperature scanning probe microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could…
Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the…
The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…
We report the implementation of a dilution-refrigerator-based scanning microwave impedance microscope (MIM) with a base temperature of ~ 100 mK. The vibration noise of our apparatus with tuning-fork feedback control is as low as 1 nm. Using…
We describe the construction and performance of a scanning tunneling microscope (STM) capable of taking maps of the tunneling density of states with sub-atomic spatial resolution at dilution refrigerator temperatures and high (14 T)…