Related papers: Digital control of force microscope cantilevers us…
Quartz tuning fork-based atomic force microscopy (QTF-AFM) has become a powerful tool for high-resolution imaging of both conductive and insulating samples, including semiconductor structures and metal-coated surfaces as well as soft matter…
Electronic systems for qubit control and measurement serve as a bridge between quantum programming language and quantum information processors. With the rapid development of superconducting quantum circuit (SQC) technology, synchronization…
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…
Multi-frame algorithms for single-channel speech enhancement are able to take advantage from short-time correlations within the speech signal. Deep filtering (DF) recently demonstrated its capabilities for low-latency scenarios like hearing…
A Faraday force magnetometer is presented for measurements of magnetization at temperatures down to 100~mK and in magnetic fields up to 14~T. The specimen is mounted on a flexible cantilever forming a force-sensing capacitor in combination…
We review how a magnetic resonance force microscope (MRFM) can be applied to perform ferromagnetic resonance (FMR) spectroscopy of \emph{individual} sub-micron size samples. We restrict our attention to a thorough study of the spin-wave…
Quality factor plays a fundamental role in dynamic mode atomic force microscopy. We present a technique to modify the quality factor of an atomic force microscopy cantilever within a Fabry-P\'erot optical interferometer. The experimental…
In single spin Magnetic Resonance Force Microscopy (MRFM), the objective is to detect the presence of an electron (or nuclear) spin in a sample volume by measuring spin-induced attonewton forces using a micromachined cantilever. In the…
Field Programmable Gate Array technology (FPGA) is a highly configurable option for implementing many sophisticated signal processing tasks in Software Defined Radios (SDRs). Those types of radios are realized using highly configurable…
In this work, we discuss and numerically validate a strategy to attain reversible macroscopic changes in the wave propagation characteristics of cellular metamaterials with soft microstructures. The proposed cellular architecture is…
The paper presents a current tunable multifunction filter using current conveyor. The proposed circuit can be realized as on chip tunable low pass, high pass, band pass and elliptical notch filter. The circuit employs two current conveyors,…
It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…
A method to measure the viscosity of liquids at microscales is presented. It uses a thin glass fiber fixed on the tip of the cantilever of an extremely low noise Atomic Force Microscope (AFM), which accurately measures the cantilever…
We present a system for generating arbitrary, triaxial magnetic waveforms with a spectral content spanning from DC to tens of kHz, a critical capability for quantum control and spin manipulation. To compensate for amplifier-coil dynamics,…
A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
When measuring quadratic values representative of random fluctuations, such as the thermal noise of Atomic Force Microscopy (AFM) cantilevers, the background measurement noise cannot be averaged to zero. We present a signal processing…
A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to…
The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…