Related papers: Imaging Mechanism of Piezoresponse Force Microscop…
Understanding various aspects of ferroelectricity in hafnia-based nanomaterials is of vital importance for the development of future non-volatile memory and logic devices. Here, the unconventional and weak electromechanical response of…
In computational phase imaging with a microscope equipped with an array of light emitting diodes as illumination unit, conventional Fourier ptychographic microscopy achieves high resolution and wide-field reconstructions but is constrained…
Reducing the dimensions of ferroelectric materials down to the nanoscale has strong implications on the ferroelectric polarization pattern and on the ability to switch the polarization. As the size of ferroelectric domains shrinks to…
Fourier ptychographic microscopy (FPM), characterized by high-throughput computational imaging, theoretically provides a cunning solution to the trade-off between spatial resolution and field of view (FOV), which has a promising prospect in…
Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique for wide-field, high-resolution microscopy with a high space-bandwidth product. It integrates the concepts of synthetic aperture and phase…
Ferroelectric switching in BiFeO$_3$ multiferroic thin films with intrinsic ``stripe-like'' and ``bubble-like'' polydomain configurations was studied by piezoresponse force microscopy. Using the local electric field applied by a scanning…
We report the observation of $180^o$ phase switching on silicon wafers by piezo-response force microscopy (PFM). The switching is hysteretic and shows remarkable similarities with polarization switching in ferroelectrics. This is always…
We previously developed a system for projection-based magnetic particle imaging (MPI) with a field-free-line (FFL) encoding scheme. In the projection-based MPI, projection data are given by the convolution between the system function in the…
The electrical generation and detection of elastic waves are the foundation for acousto-electronic and acousto-optic systems. For surface-acoustic-wave devices, micro-/nano-electromechanical systems, and phononic crystals, tailoring the…
We employ polarization tomography to characterize the modal properties of a dielectric nanocavity with sub-wavelength mode confinement. Our analysis of reflection spectra shows that the Fano-lineshape depends strongly on the polarization in…
What is a diffusion model actually doing when it turns noise into a photograph? We show that the deterministic DDIM reverse chain operates as a Partitioned Iterated Function System (PIFS) and that this framework serves as a unified design…
Proton imaging is a powerful tool for probing electromagnetic fields in a plasma, providing a path-integrated map of the field topology. However, in cases where the field structure is highly inhomogeneous, inferring spatial properties of…
We spatially resolve photocarrier dynamics in halide perovskites using time-resolved electrostatic force microscopy (trEFM) to map surface potential equilibration during photoexcitation. Following treatment with different surface…
Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long term development for reducing the sizes of devices, the preparation of ferroelectric materials and devices are entering…
The electrical response of ferroelectric domain walls is often influenced by their geometry underneath the sample surface. Tomographic imaging in these material systems has therefore become increasingly important for its ability to…
Domain-wall dynamics in ferroelectric materials are strongly position-dependent since each polar interface is locked into a unique local microstructure. This necessitates spatially resolved studies of the wall-pinning using scanning-probe…
Domains walls and topological defects in ferroelectric materials have emerged as a powerful new paradigm for functional electronic devices including memory and logic. Similarly, wall interactions and dynamics underpin a broad range of…
Fourier ptychographic microscopy (FPM) is a novel computational coherent imaging technique for high space-bandwidth product imaging. Mathematically, Fourier ptychographic (FP) reconstruction can be implemented as a phase retrieval…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…