Related papers: Memory Testing Under Different Stress Conditions: …
Dynamic state and parameter estimation methods for dynamic security assessment in power systems are becoming increasingly important for system operators. Usually, the data used for this type of applications stems from phasor measurement…
In this paper, we present a unified FPGA based electrical test-bench for characterizing different emerging NonVolatile Memory (NVM) chips. In particular, we present detailed electrical characterization and benchmarking of multiple…
Emerging memristor-based array architectures have been effectively employed in non-volatile memories and neuromorphic computing systems due to their density, scalability and capability of storing information. Nonetheless, to demonstrate a…
In this paper, we propose a deep learning based performance testing framework to minimize the number of required test modules while guaranteeing the accuracy requirement, where a test module corresponds to a combination of one circuit and…
The demand for precise information on DRAM microarchitectures and error characteristics has surged, driven by the need to explore processing in memory, enhance reliability, and mitigate security vulnerability. Nonetheless, DRAM…
We extensively test a recent protocol to demonstrate quantum fault tolerance on three systems: (1) a real-time simulation of five spin qubits coupled to an environment with two-level defects, (2) a real-time simulation of transmon quantum…
To assess the viability of a shallow-depth neutrino detector, a Cosmic Muon Veto Detector (CMVD) is being constructed on top of the stack of Resistive Plate Chamber (RPC) detectors at TIFR, Mumbai. The CMVD employs extruded plastic…
Quantum computing testbeds exhibit high-fidelity quantum control over small collections of qubits, enabling performance of precise, repeatable operations followed by measurements. Currently, these noisy intermediate-scale devices can…
Large-scale LLM training is increasingly susceptible to hardware defects stemming from manufacturing escapes and silicon aging. These defects manifest as Silent Data Corruption (SDC) that perturb gradients and parameters throughout the…
Memory simulators are used to estimate application performance on advanced memory systems, yet they may exhibit significant discrepancies compared to real hardware. This paper investigates two key questions: (1) what causes these…
This paper summarizes the SoftMC DRAM characterization infrastructure, which was published in HPCA 2017, and examines the work's significance and future potential. SoftMC (Soft Memory Controller) is the first publicly-available DRAM testing…
The selection of a validation basis from a full dataset is often required in industrial use of supervised machine learning algorithm. This validation basis will serve to realize an independent evaluation of the machine learning model. To…
The aim of this study was to check how efficient can be smoothed finite element method (FEM) for solution of the linear fracture mechanics problems. Accuracy of stress intensity factor (SIF) computation were investigated using three types…
Phase-change memory (PCM) is a scalable and low latency non-volatile memory (NVM) technology that has been proposed to serve as storage class memory (SCM), providing low access latency similar to DRAM and often approaching or exceeding the…
Embedded Systems combine one or more processor cores with dedicated logic running on an ASIC or FPGA to meet design goals at reasonable cost. It is achieved by profiling the application with variety of aspects like performance, memory…
When changes are performed on an automated production system (aPS), new faults can be accidentally introduced in the system, which are called regressions. A common method for finding these faults is regression testing. In most cases, this…
Silicon Photomultipliers (SiPM) represent a promising alternative to classical photomultipliers, for instance, for the detection of photons in high energy physics and medical physics. In the present work, electrical characterizations of…
Electromagnetic fault injection (EMFI) is a well known technique used to disturb the behaviour of a chip for weakening its security. These attacks are mostly done on simple microcontrollers. On these targets, the fault effects are…
Impedance spectroscopy is vital for material characterization and assessing electrochemical device performance. It provides real-time analysis of dynamic processes such as electrode kinetics, electrons, holes or ion transport, and…
The functionality of electronic circuits can be seriously impaired by the occurrence of dynamic hardware faults. Particularly, for digital ultra low-power systems, a reduced safety margin can increase the probability of dynamic failures.…