Related papers: X-ray diffraction from shock-loaded polycrystals
We calculate the optical diffraction radiation generated by a bunch of high energy particles as they pass through a round hole within an annular metallic ring. We derive expressions for the differential angular spectrum in the far-field and…
Results of reflectivity measurements of mosaic crystal samples of Cu (111) are reported. These tests were performed in the context of a feasibility study of a hard X-ray focusing telescope for space astronomy with energy passband from 60 to…
This paper describes the development of X-ray diffractive optics for imaging solar flares with better than 0.1 arcsec angular resolution. X-ray images with this resolution of the \geq10 MK plasma in solar active regions and solar flares…
With the rapid development of short-pulse intense laser sources, studies of matter under extreme irradiation conditions enter further unexplored regimes. In addition, an application of X-ray Free- Electron Lasers (XFELs), delivering intense…
Laser Light Scattering (LLS) method, combined with a long-distance microscope was utilized to detect micrometer-sized particles on a smooth substrate. LLS was capable to detect individual particle release, shrink, or fragmentation during…
X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented. The films contain ${\beta}$-FeSe and Fe$_7$Se$_8$ phases in a double epitaxy configuration with the…
The transient acoustic response of a free-standing, polycrystalline thin Au film upon femtosecond optical excitation has been studied by time-resolved Debye-Scherrer X-ray diffraction using ultrashort Cu K$_{\alpha}$ X-ray pulses from a…
The in situ synchrotron high-energy X-ray powder diffraction (XRD) technique is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g., battery materials) or in complex sample…
To take advantage of high-resolution optics sensitive to a broad energy range, future X-ray imaging instruments will require thick detectors with small pixels. This pixel aspect ratio affects spectral response in the soft X-ray band, vital…
The polarisation of x-ray photons can be determined by measuring the direction of emission of a K-shell photoelectron. Effective exploitation of this effect below 10 keV would allow development of a highly sensitive x-ray polarimeter…
We demonstrate a strategy for simulating wide-range X-ray scattering patterns, which spans the small- and wide scattering angles as well as the scattering angles typically used for Pair Distribution Function (PDF) analysis. Such simulated…
The spectral dependence of the Bragg peak position under conditions of extremely asymmetric diffraction has been analyzed in the kinematical and dynamical approximations of the diffraction theory. Simulations have been performed for the…
A pump-probe dark-field X-ray microscopy (DFXM) experiment was carried out at the Advanced Photon Source (APS) with nanosecond drive laser pulses and hybrid mode X-ray probe pulses. We observe a thermal decay due to laser-induced heat…
We used a microfluidic platform to address the problems of obtaining diffraction quality crystals and crystal handling during transfer to the X-ray diffractometer. We optimize crystallization conditions of a pharmaceutical protein and…
Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative…
X-ray photoelectron diffraction is a powerful tool for determining the structure of clean and adsorbate-covered surfaces. Extending the technique into the ultrafast time domain will open the door to studies as diverse as the direct…
The low repetition rates and possible shot-to-shot variations in laser-plasma studies place a high value on single-shot diagnostics. For example, white-beam scattering methods based on broadband backlighter x-ray sources are used to…
The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray…
The imaging problem of a specular reflector is revisited. Retaining terms through second order in the reflector surface expansion, we derive the form of the aberration-limiting aperture for arbitrary magnification assuming no bandwidth…
Experimentally obtained X-ray diffraction (XRD) patterns can be difficult to solve, precluding the full characterization of materials, pharmaceuticals, and geological compounds. Herein, we propose a method based upon a multi-objective…