Related papers: Dielectric microscopy with submillimeter resolutio…
Microwave energy has been demonstrated to be beneficial for reducing the energetic cost of several steps of the mining process. Significant literature has been developed about this topic but few studies are focused on understanding the…
Recently, imaging by microspheres and dielectric particle-lenses emerged as a simple solution to obtaining super-resolution images of nanoscale devices and structures. Calibrated resolution of ~{\lambda}/6 - {\lambda}/8 has been…
Waveguide characterization of dielectric materials is a convenient and broadband approach for measuring dielectric constant. In conventional microwave measurements, material samples are usually mechanically shaped to fit the waveguide…
By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center…
We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope properties approach those of a spatially-resolved impedance…
Natural sedimentation processes give rise to fine layers in shales. If these layers alternate between organic-rich and organic-poor sediments, then the contrast in dielectric properties gives rise to an effective birefringence as the…
Molecular and atomic imaging required the development of electron and scanning probe microscopies to surpass the physical limits dictated by diffraction. Nano-infrared experiments and pico-cavity tip-enhanced Raman spectroscopy imaging…
The {\AA}ngstr\"om-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition.…
We exploit millimeter wave technology to measure the reflection and transmission response of random dielectric media. Our samples are easily constructed from random stacks of identical, sub-wavelength quartz and Teflon wafers. The…
We demonstrate a neutron tomography technique with sub-micrometer spatial resolution. Our method consists of measuring neutron diffraction spectra using a double crystal diffractometer as a function of sample rotation and then using a phase…
One region of the electromagnetic spectrum that is relatively unexploited for materials characterization is the millimeter wave band (frequencies roughly between 40 and 300 GHz). Millimeter wave techniques involve free-space…
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…
We study light propagation in nanoscale periodic structures composed of dielectric and metal in the visible range. We demonstrate that diffraction can be tailored both in magnitude and in sign by varying the geometric features of the…
The dielectric properties of selected conductively-loaded polyimide samples are characterized in microwave through far infrared wavebands. These materials, belonging to the Vespel\textsuperscript{\textregistered} family, are more readily…
The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is…
We describe the use of a cryogenic near-field scanning microwave microscope to image microwave electric fields from superconducting and normal-metal microstrip resonators. The microscope employs an open-ended coaxial probe and operates from…
We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either…
We realize a scanning probe microscope using single trapped $^{87}$Rb atoms to measure optical fields with subwavelength spatial resolution. Our microscope operates by detecting fluorescence from a single atom driven by near-resonant light…
In this study, four different techniques are presented. 1 Rectangular waveguide measurement technique for normal microwave materials microwave properties such as permeability and permittivity. This technique removed guess parameter and…
A stripline-type near-field microwave probe is microfabricated for microwave impedance microscopy. Unlike the poorly shielded coplanar probe that senses the sample tens of microns away, the stripline structure removes the stray fields from…