A streamlined technique for the electrochemical fabrication of metal nanojunctions (MNJs) between lithographically defined electrodes is presented. The first low-temperature transport measurements in such structures reveal suppression of the conductance near zero-bias. The size of the zero-bias anomaly (ZBA) depends strongly on the fabrication electrochemistry and the dimensions of the resulting MNJ. We present evidence that the nonperturbative ZBA in atomic-scale junctions is due to a density of states suppression in the leads.
@article{arxiv.cond-mat/0307549,
title = {Zero-bias anomalies in electrochemically fabricated nanojunctions},
author = {L. H. Yu and D. Natelson},
journal= {arXiv preprint arXiv:cond-mat/0307549},
year = {2009}
}