X-ray properties of X-CLASS-redMaPPer galaxy cluster sample: The luminosity-temperature relation

This paper presents results of a spectroscopic analysis of the X-CLASS-redMaPPer (XC1-RM) galaxy cluster sample. X-CLASS is a serendipitous search for clusters in the X-ray wavebands based on the XMM-Newton archive, whereas redMaPPer is an optical cluster catalogue derived from the Sloan Digital Sky Survey (SDSS). The present sample comprises 92 X-ray extended sources identified in optical images within 1\arcmin~separation. The area covered by the cluster sample is $\sim$ 27 deg$^{2}$. The clusters span a wide redshift range (0.05 < z < 0.6) and 88 clusters benefit from spectrosopically confirmed redshifts using data from SDSS Data Release 14. We present an automated pipeline to derive the X-ray properties of the clusters in three distinct apertures: R\textsubscript{500} (at fixed mass overdensity), R\textsubscript{fit} (at fixed signal-to-noise ratio), R\textsubscript{300kpc} (fixed physical radius). The sample extends over wide temperature and luminosity ranges: from 1 to 10 keV and from 6$\times$10$^{42}$ to 11$\times$10$^{44}$ erg\,s$^{-1}$, respectively. We investigate the luminosity-temperature (L-T) relation of the XC1-RM sample and find a slope equals to 3.03 $\pm$ 0.26. It is steeper than predicted by self-similar assumptions, in agreement with independent studies. A simplified approach is developed to estimate the amount and impact of selection biases which might be affecting our recovered L-T parameters. The result of this simulation process suggests that the measured L-T relation is biased to a steeper slope and higher normalization.