X-band microwave generation caused by plasma-sheath instability
Abstract
It is well known that oscillations at the electron plasma frequency may appear due to instability of the plasma sheath near a positively biased electrode immersed in plasma. This instability is caused by transit-time effects when electrons, collected by this electrode, pass through the sheath. Such oscillations appear as low-power short spikes due to additional ionization of a neutral gas in the electrode vicinity. Herein we present first results obtained when the additional ionization was eliminated. We succeeded to prolong the oscillations during the whole time a positive bias was applied to the electrode. These oscillations could be obtained at much higher frequency than previously reported (tens of GHz compared to few hundreds of MHz) and power of tens of mW. These results in combination with presented theoretical estimations may be useful, e.g., for plasma diagnostics.
Cite
@article{arxiv.1109.2689,
title = {X-band microwave generation caused by plasma-sheath instability},
author = {Y. Bliokh and J. Felsteiner and Ya. Z. Slutsker},
journal= {arXiv preprint arXiv:1109.2689},
year = {2015}
}
Comments
12 pages, 7 figures