English

Well-posedness of the stochastic thin-film equation with an interface potential

Analysis of PDEs 2026-01-09 v3 Probability

Abstract

We consider strictly positive solutions to a class of fourth-order conservative quasilinear SPDEs on the dd-dimensional torus modeled after the stochastic thin-film equation. We prove local Lipschitz estimates in Bessel potential spaces under minimal assumptions on the parameters and corresponding stochastic maximal LpL^p-regularity estimates for thin-film type operators with measurable in-time coefficients. As a result, we deduce local well-posedness of the stochastic thin-film equation as well as blow-up criteria and instantaneous regularization for the solution. In dimension one, we additionally close α\alpha-entropy estimates and subsequently an energy estimate for the stochastic thin-film equation with an interface potential so that global well-posedness follows. We allow for a wide range of mobility functions including the power laws unu^n for n[0,6)n\in [0,6) as long as the interface potential is sufficiently repulsive.

Keywords

Cite

@article{arxiv.2403.12652,
  title  = {Well-posedness of the stochastic thin-film equation with an interface potential},
  author = {Antonio Agresti and Max Sauerbrey},
  journal= {arXiv preprint arXiv:2403.12652},
  year   = {2026}
}

Comments

Improved presentation. To appear in Communications in Mathematical Physics. 48 pages