Well-posedness of the stochastic thin-film equation with an interface potential
Abstract
We consider strictly positive solutions to a class of fourth-order conservative quasilinear SPDEs on the -dimensional torus modeled after the stochastic thin-film equation. We prove local Lipschitz estimates in Bessel potential spaces under minimal assumptions on the parameters and corresponding stochastic maximal -regularity estimates for thin-film type operators with measurable in-time coefficients. As a result, we deduce local well-posedness of the stochastic thin-film equation as well as blow-up criteria and instantaneous regularization for the solution. In dimension one, we additionally close -entropy estimates and subsequently an energy estimate for the stochastic thin-film equation with an interface potential so that global well-posedness follows. We allow for a wide range of mobility functions including the power laws for as long as the interface potential is sufficiently repulsive.
Keywords
Cite
@article{arxiv.2403.12652,
title = {Well-posedness of the stochastic thin-film equation with an interface potential},
author = {Antonio Agresti and Max Sauerbrey},
journal= {arXiv preprint arXiv:2403.12652},
year = {2026}
}
Comments
Improved presentation. To appear in Communications in Mathematical Physics. 48 pages