Visual investigation of possible degradation in GEM foil under test

S. Chatterjee; A. Sen; S. Das; S. Biswas

doi:10.1016/j.nima.2022.167573

Visual investigation of possible degradation in GEM foil under test

Instrumentation and Detectors 2024-01-25 v1 High Energy Physics - Experiment

Authors: S. Chatterjee , A. Sen , S. Das , S. Biswas

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Abstract

Visual investigation of a Single Mask (SM) Gas Electron Multiplier (GEM) foil, showing small resistance~( $\sim$ 40 k $\Omega$ ), is performed manually using an optical microscope. The GEM foil is scanned and the different imperfections in the foil are identified. Different techniques are used to clean the GEM foil to remove the short paths created between the GEM electrodes. The details of the method used for cleaning the GEM foil and the result of leakage current measurement after the cleaning of the foil are discussed in this article.

Keywords

gas electron multiplier gem foil visual inspection leakage current cleaning degradation

Cite

@article{arxiv.2206.04052,
  title  = {Visual investigation of possible degradation in GEM foil under test},
  author = {S. Chatterjee and A. Sen and S. Das and S. Biswas},
  journal= {arXiv preprint arXiv:2206.04052},
  year   = {2024}
}

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