English

Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories

Applied Physics 2019-05-22 v1 Superconductivity

Abstract

Arrays of Vortex Transitional (VT) memory cells with functional density up to 1Mbit/cm21 Mbit/cm^2 have been designed, fabricated, and successfully demonstrated. This progress is due to recent advances in design optimization and in superconductor electronics fabrication achieved at MIT Lincoln Laboratory. As a starting point, we developed a demo array of VT cells for the 100-μA/μm2{\mu}A/{\mu}m^2 MIT LL fabrication process SFQ5ee with 8 niobium layers. The studied two-junction memory cell with a two-junction nondestructive readout occupied 168μm2168 {\mu}m^2, resulting in an over 0.5Mbit/cm20.5 Mbit/cm^2 functional density. Then, we reduced the cell area down to 99μm299 {\mu}m^2 (corresponding to over 0.9Mbit/cm20.9 Mbit/cm^2 functional density) by utilizing self-shunted Josephson Junctions (JJs) with critical current density, JcJ_c of 600μA/μm2600 {\mu}A/{\mu}m^2 and eliminating shunt resistors. The fabricated high-JcJ_c memory cells were fully operational and possessed wide Read/Write current margins, quite close to the theoretically predicted values. We discuss approaches to further increasing the integration scale of superconductor memory and logic circuits: a) miniaturization of superconducting transformers by using soft magnetic materials; b) reduction of JJ area by using planar high-JcJ_c junctions similar to variable thickness bridges.

Keywords

Cite

@article{arxiv.1902.08302,
  title  = {Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories},
  author = {Vasili K. Semenov and Yuri A. Polyakov and Sergey K. Tolpygo},
  journal= {arXiv preprint arXiv:1902.08302},
  year   = {2019}
}

Comments

9 pages, 10 figures, 1 Table, 49 references. Submitted to IEEE Transactions on Applied Superconductivity on October 30, 2018; in revised version on February 22, 2019. Presented at Applied Superconductivity Conference ASC 2018, 28 Oct.- 2 Nov. 2018, Seattle, WA, USA; paper 4EPo-1D