Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories
Abstract
Arrays of Vortex Transitional (VT) memory cells with functional density up to have been designed, fabricated, and successfully demonstrated. This progress is due to recent advances in design optimization and in superconductor electronics fabrication achieved at MIT Lincoln Laboratory. As a starting point, we developed a demo array of VT cells for the 100- MIT LL fabrication process SFQ5ee with 8 niobium layers. The studied two-junction memory cell with a two-junction nondestructive readout occupied , resulting in an over functional density. Then, we reduced the cell area down to (corresponding to over functional density) by utilizing self-shunted Josephson Junctions (JJs) with critical current density, of and eliminating shunt resistors. The fabricated high- memory cells were fully operational and possessed wide Read/Write current margins, quite close to the theoretically predicted values. We discuss approaches to further increasing the integration scale of superconductor memory and logic circuits: a) miniaturization of superconducting transformers by using soft magnetic materials; b) reduction of JJ area by using planar high- junctions similar to variable thickness bridges.
Keywords
Cite
@article{arxiv.1902.08302,
title = {Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories},
author = {Vasili K. Semenov and Yuri A. Polyakov and Sergey K. Tolpygo},
journal= {arXiv preprint arXiv:1902.08302},
year = {2019}
}
Comments
9 pages, 10 figures, 1 Table, 49 references. Submitted to IEEE Transactions on Applied Superconductivity on October 30, 2018; in revised version on February 22, 2019. Presented at Applied Superconductivity Conference ASC 2018, 28 Oct.- 2 Nov. 2018, Seattle, WA, USA; paper 4EPo-1D