Verifying entanglement in the Hong-Ou-Mandel dip

Megan R. Ray; Steven J. van Enk

doi:10.1103/PhysRevA.83.042318

Verifying entanglement in the Hong-Ou-Mandel dip

Quantum Physics 2015-05-20 v1

Authors: Megan R. Ray , Steven J. van Enk

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Abstract

The Hong-Ou-Mandel interference dip is caused by an entangled state, a delocalized bi-photon state. We propose a method of detecting this entanglement by utilizing inverse Hong-Ou-Mandel interference, while taking into account vacuum and multi-photon contaminations, phase noise, and other imperfections. The method uses just linear optics and photodetectors, and for single-mode photodetectors we find a lower bound on the amount of entanglement.

Keywords

entanglement verification Hong-Ou-Mandel interference bi-photon state linear optics photodetectors quantum optics

Cite

@article{arxiv.1101.0846,
  title  = {Verifying entanglement in the Hong-Ou-Mandel dip},
  author = {Megan R. Ray and Steven J. van Enk},
  journal= {arXiv preprint arXiv:1101.0846},
  year   = {2015}
}

Comments

5 pages, 2 figures

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