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Variational Bayesian Last Layers

Machine Learning 2024-04-18 v1 Computer Vision and Pattern Recognition Machine Learning

Abstract

We introduce a deterministic variational formulation for training Bayesian last layer neural networks. This yields a sampling-free, single-pass model and loss that effectively improves uncertainty estimation. Our variational Bayesian last layer (VBLL) can be trained and evaluated with only quadratic complexity in last layer width, and is thus (nearly) computationally free to add to standard architectures. We experimentally investigate VBLLs, and show that they improve predictive accuracy, calibration, and out of distribution detection over baselines across both regression and classification. Finally, we investigate combining VBLL layers with variational Bayesian feature learning, yielding a lower variance collapsed variational inference method for Bayesian neural networks.

Keywords

Cite

@article{arxiv.2404.11599,
  title  = {Variational Bayesian Last Layers},
  author = {James Harrison and John Willes and Jasper Snoek},
  journal= {arXiv preprint arXiv:2404.11599},
  year   = {2024}
}

Comments

International Conference on Learning Representations (ICLR) 2024

R2 v1 2026-06-28T15:57:39.439Z