Vacancy-mediated nitrogen diffusion and aggregation via high-fluence electron beam irradiation in HPHT synthesized diamond crystal
Abstract
The negatively charged nitrogen vacancy (NV-) center in diamonds is promising point defect for highly sensitive quantum sensing. The formation of high-density NV- centers is essential for improving sensitivity. We performed room-temperature electron beam irradiation (EBI) and annealing on nitrogen-doped high-pressure high-temperature diamond crystals to convert substitutional nitrogen into NV centers. In the low-fluence region of EBI, neutral substitutional nitrogen (Ns0) concentration decreased and NV0 and NV- center concentration increased with increasing EBI fluence. The decrease in Ns0 concentration was comparable to the increase in total NV center concentration; thus, the conversion from Ns0 to NV0 and NV- centers is a dominant defect formation process. In a high-fluence region, NV0 and NV- center and Ns0 and Ns+ concentrations decreased with increasing EBI fluence, indicating the formation of unknown nitrogen-related defects such as the H3 center, which is a nitrogen and vacancy aggregation defect. Although H3 centers were observed at high EBI fluence, their forming annealing temperature of 1375 +- 25 degrees Celsius was lower than the typically reported temperatures over 1600 degrees Celsius. We attribute this low-temperature formation to vacancy-mediated nitrogen diffusion and aggregation.
Keywords
Cite
@article{arxiv.2606.27723,
title = {Vacancy-mediated nitrogen diffusion and aggregation via high-fluence electron beam irradiation in HPHT synthesized diamond crystal},
author = {Chikara Shinei and Yuta Masuyama and Jun Chen and Hiroshi. Abe and Masashi Miyakawa and Takashi Taniguchi and Takeshi Ohshima and Tokuyuki Teraji},
journal= {arXiv preprint arXiv:2606.27723},
year = {2026}
}