English

Unlocking device-scale atomistic modelling of phase-change memory materials

Materials Science 2022-09-20 v2

Abstract

Quantum-accurate computer simulations play a central role in understanding phase-change materials (PCMs) for advanced memory technologies. However, direct quantum-mechanical simulations are necessarily limited to simplified models, containing no more than a few hundred or a thousand atoms. Machine learning (ML) based potential models that are "trained" on quantum-mechanical data are an emerging alternative approach, currently evolving from highly specialised to more widely applied simulation tools. Here we show that a universal, compositionally flexible ML model can describe a wide range of flagship Ge-Sb-Te PCMs under real device conditions, including non-isothermal heating and chemical disorder which are relevant for memory applications. The speed of the ML model enables atomistic simulations of multiple thermal cycles and delicate operations for neuro-inspired computing, namely, cumulative SET and iterative RESET. A device-scale capability demonstration (40 x 20 x 20 nm3) shows that the new ML potential can directly describe technologically relevant processes in PCM-based memory products. In a wider context, our work demonstrates how ML-driven materials simulations are now entering a stage where they can guide architecture design for high-performance electronic devices.

Keywords

Cite

@article{arxiv.2207.14228,
  title  = {Unlocking device-scale atomistic modelling of phase-change memory materials},
  author = {Yuxing Zhou and Wei Zhang and En Ma and Volker L. Deringer},
  journal= {arXiv preprint arXiv:2207.14228},
  year   = {2022}
}
R2 v1 2026-06-25T01:18:39.358Z