Universal super-resolution framework for imaging of quantum dots

We present a universal deep-learning method that reconstructs super-resolved images of quantum emitters from a single camera frame measurement. Trained on physics-based synthetic data spanning diverse point-spread functions, aberrations, and noise, the network generalizes across experimental conditions without system-specific retraining. We validate the approach on low- and high-density In(Ga)As quantum dots and strain-induced dots in 2D monolayer WSe$_2$, resolving overlapping emitters even under low signal-to-noise and inhomogeneous backgrounds. By eliminating calibration and iterative acquisitions, this single-shot strategy enables rapid, robust super-resolution for nanoscale characterization and quantum photonic device fabrication.