English

Universal contact-line dynamics at the nanoscale

Soft Condensed Matter 2015-12-03 v1

Abstract

The relaxation dynamics of the contact angle between a viscous liquid and a smooth substrate is studied at the nanoscale. Through atomic force microscopy measurements of polystyrene nanostripes we monitor simultaneously the temporal evolution of the liquid-air interface as well as the position of the contact line. The initial configuration exhibits high curvature gradients and a non-equilibrium contact angle that drive liquid flow. Both these conditions are relaxed to achieve the final state, leading to three successive regimes along time: i) stationary-contact-line levelling; ii) receding-contact-line dewetting; iii) collapse of the two fronts. For the first regime, we reveal the existence of a self-similar evolution of the liquid interface, which is in excellent agreement with numerical calculations from a lubrication model. For different liquid viscosities and film thicknesses we provide evidence for a transition to dewetting featuring a universal critical contact angle and dimensionless time.

Keywords

Cite

@article{arxiv.1507.08864,
  title  = {Universal contact-line dynamics at the nanoscale},
  author = {Marco Rivetti and Thomas Salez and Michael Benzaquen and Elie Raphaël and Oliver Bäumchen},
  journal= {arXiv preprint arXiv:1507.08864},
  year   = {2015}
}

Comments

7 pages, 5 figures

R2 v1 2026-06-22T10:23:23.633Z