In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.
@article{arxiv.2210.13244,
title = {Understanding the direct detection of charged particles with SiPMs},
author = {F. Carnesecchi and G. Vignola and N. Agrawal and A. Alici and P. Antonioli and S. Arcelli and F. Bellini and D. Cavazza and L. Cifarelli and M. Colocci and S. Durando and F. Ercolessi and A. Ficorella and C. Fraticelli and M. Garbini and M. Giacalone and A. Gola and D. Hatzifotiadou and N. Jacazio and A. Margotti and G. Malfattore and R. Nania and F. Noferini and G. Paternoster and O. Pinazza and R. Preghenella and R. Rath and R. Ricci and L. Rignanese and N. Rubini and B. Sabiu and E. Scapparone and G. Scioli and S. Strazzi and S. Tripathy and A. Zichichi},
journal= {arXiv preprint arXiv:2210.13244},
year = {2022}
}