Ultrafast electron diffractometer with Terahertz-driven pulse compression
Abstract
Terahertz (THz)-based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next-generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.
Cite
@article{arxiv.2104.06871,
title = {Ultrafast electron diffractometer with Terahertz-driven pulse compression},
author = {Dongfang Zhang and Tobias Kroh and Felix Ritzkowsky and Timm Rohwer and Moein Fakhari and Huseyin Cankaya and Anne-Laure Calendron and Nicholas H. Matlis and Franz X. Kärtner},
journal= {arXiv preprint arXiv:2104.06871},
year = {2021}
}
Comments
16 pages, 5 figures. arXiv admin note: text overlap with arXiv:1910.06639