English

Two-junction superconductor-normal metal single-electron trap in a combined on-chip RC environment

Mesoscale and Nanoscale Physics 2015-05-28 v1

Abstract

Dissipative properties of the electromagnetic environment as well as on-chip RC filtering are shown to suppress random state switchings in the two-junction superconductor(S) - normal metal(N) electron trap. In our experiments, a local high-ohmic resistor increased the hold time of the trap by up to two orders of magnitude. A strong effect of on-chip noise filtering was observed for different on-chip geometries. The obtained results are promising for realization of the current standard on the basis of the S-N hybrid turnstile.

Keywords

Cite

@article{arxiv.1106.6005,
  title  = {Two-junction superconductor-normal metal single-electron trap in a combined on-chip RC environment},
  author = {Sergey V. Lotkhov and Alexander B. Zorin},
  journal= {arXiv preprint arXiv:1106.6005},
  year   = {2015}
}

Comments

4 pages 3 figures LT26