English

TRIAD: a triple patterning lithography aware detailed router

Hardware Architecture 2014-02-14 v1

Abstract

TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG. This work proposes a token graph-embedded conflict graph (TECG) to facilitate the TPL conflict detection while maintaining high coloring-flexibility. We then develop a TPL aware detailed router (TRIAD) by applying TECG to a gridless router with the TPL stitch generation. Compared to a greedy coloring approach, experimental results indicate that TRIAD generates no conflicts and few stitches with shorter wirelength at the cost of 2.41x of runtime.

Keywords

Cite

@article{arxiv.1402.2906,
  title  = {TRIAD: a triple patterning lithography aware detailed router},
  author = {Yen-Hung Lin and Bei Yu and David Z. Pan and Yih-Lang Li},
  journal= {arXiv preprint arXiv:1402.2906},
  year   = {2014}
}
R2 v1 2026-06-22T03:06:59.210Z