Industrial product inspection is often performed using Anomaly Detection (AD) frameworks trained solely on non-defective samples. Although defective samples can be collected during production, leveraging them usually requires pixel-level annotations, limiting scalability. To address this, we propose ADClick, an Interactive Image Segmentation (IIS) algorithm for industrial anomaly detection. ADClick generates pixel-wise anomaly annotations from only a few user clicks and a brief textual description, enabling precise and efficient labeling that significantly improves AD model performance (e.g., AP = 96.1\% on MVTec AD). We further introduce ADClick-Seg, a cross-modal framework that aligns visual features and textual prompts via a prototype-based approach for anomaly detection and localization. By combining pixel-level priors with language-guided cues, ADClick-Seg achieves state-of-the-art results on the challenging ``Multi-class'' AD task (AP = 80.0\%, PRO = 97.5\%, Pixel-AUROC = 99.1\% on MVTec AD).
@article{arxiv.2509.05034,
title = {Towards Efficient Pixel Labeling for Industrial Anomaly Detection and Localization},
author = {Jingqi Wu and Hanxi Li and Lin Yuanbo Wu and Hao Chen and Deyin Liu and Peng Wang},
journal= {arXiv preprint arXiv:2509.05034},
year = {2025}
}