English

Topological Data Analysis of Ion Migration Mechanism

Materials Science 2023-04-26 v1

Abstract

Topological data analysis based on persistent homology has been applied to the molecular dynamics simulation for the fast ion-conducting phase (α\alpha-phase) of AgI, to show its effectiveness on the ion-migration mechanism analysis.Time-averaged persistence diagrams of α\alpha-AgI, which quantitatively records the shape and size of the ring structures in the given atomic configurations, clearly showed the emergence of the four-membered rings formed by two Ag and two I ions at high temperatures. They were identified as common structures during the Ag ion migration. The averaged potential energy change due to the deformation of four-membered ring during Ag migration agrees well with the activation energy calculated from the conductivity Arrhenius plot. The concerted motion of two Ag ions via the four-membered ring was also successfully extracted from molecular dynamics simulations by our approach, providing the new insight into the specific mechanism of the concerted motion.

Keywords

Cite

@article{arxiv.2303.07719,
  title  = {Topological Data Analysis of Ion Migration Mechanism},
  author = {Ryuhei Sato and Kazuto Akagi and Shigeyuki Takagi and Kartik Sau and Kazuaki Kisu and Hao Li and Shin-ichi Orimo},
  journal= {arXiv preprint arXiv:2303.07719},
  year   = {2023}
}

Comments

8 pages, 7 figures