Topological Data Analysis of Ion Migration Mechanism
Abstract
Topological data analysis based on persistent homology has been applied to the molecular dynamics simulation for the fast ion-conducting phase (-phase) of AgI, to show its effectiveness on the ion-migration mechanism analysis.Time-averaged persistence diagrams of -AgI, which quantitatively records the shape and size of the ring structures in the given atomic configurations, clearly showed the emergence of the four-membered rings formed by two Ag and two I ions at high temperatures. They were identified as common structures during the Ag ion migration. The averaged potential energy change due to the deformation of four-membered ring during Ag migration agrees well with the activation energy calculated from the conductivity Arrhenius plot. The concerted motion of two Ag ions via the four-membered ring was also successfully extracted from molecular dynamics simulations by our approach, providing the new insight into the specific mechanism of the concerted motion.
Keywords
Cite
@article{arxiv.2303.07719,
title = {Topological Data Analysis of Ion Migration Mechanism},
author = {Ryuhei Sato and Kazuto Akagi and Shigeyuki Takagi and Kartik Sau and Kazuaki Kisu and Hao Li and Shin-ichi Orimo},
journal= {arXiv preprint arXiv:2303.07719},
year = {2023}
}
Comments
8 pages, 7 figures