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Top-k Training of GANs: Improving GAN Performance by Throwing Away Bad Samples

Machine Learning 2020-10-26 v4 Machine Learning

Abstract

We introduce a simple (one line of code) modification to the Generative Adversarial Network (GAN) training algorithm that materially improves results with no increase in computational cost: When updating the generator parameters, we simply zero out the gradient contributions from the elements of the batch that the critic scores as `least realistic'. Through experiments on many different GAN variants, we show that this `top-k update' procedure is a generally applicable improvement. In order to understand the nature of the improvement, we conduct extensive analysis on a simple mixture-of-Gaussians dataset and discover several interesting phenomena. Among these is that, when gradient updates are computed using the worst-scoring batch elements, samples can actually be pushed further away from their nearest mode. We also apply our method to recent GAN variants and improve state-of-the-art FID for conditional generation from 9.21 to 8.57 on CIFAR-10.

Keywords

Cite

@article{arxiv.2002.06224,
  title  = {Top-k Training of GANs: Improving GAN Performance by Throwing Away Bad Samples},
  author = {Samarth Sinha and Zhengli Zhao and Anirudh Goyal and Colin Raffel and Augustus Odena},
  journal= {arXiv preprint arXiv:2002.06224},
  year   = {2020}
}

Comments

NeurIPS 2020. Samarth Sinha and Zhengli Zhao contributed equally as joint first authors

R2 v1 2026-06-23T13:42:22.291Z