Tool-to-Tool Matching Analysis Based Difference Score Computation Methods for Semiconductor Manufacturing
Abstract
We consider the problem of tool-to-tool matching (TTTM), also called, chamber matching in the context of a semiconductor manufacturing equipment. Traditional TTTM approaches utilize static configuration data or depend on a golden reference which are difficult to obtain in a commercial manufacturing line. Further, existing methods do not extend very well to a heterogeneous setting, where equipment are of different make-and-model, sourced from different equipment vendors. We propose novel TTTM analysis pipelines to overcome these issues. We hypothesize that a mismatched equipment would have higher variance and/or higher number of modes in the data. Our best univariate method achieves a correlation coefficient >0.95 and >0.5 with the variance and number of modes, respectively showing that the proposed methods are effective. Also, the best multivariate method achieves a correlation coefficient >0.75 with the top-performing univariate methods, showing its effectiveness. Finally, we analyze the sensitivity of the multivariate algorithms to the algorithm hyper-parameters.
Cite
@article{arxiv.2507.10564,
title = {Tool-to-Tool Matching Analysis Based Difference Score Computation Methods for Semiconductor Manufacturing},
author = {Sameera Bharadwaja H. and Siddhrath Jandial and Shashank S. Agashe and Rajesh Kumar Reddy Moore and Youngkwan Kim},
journal= {arXiv preprint arXiv:2507.10564},
year = {2025}
}