English

ToLo: A Two-Stage, Training-Free Layout-To-Image Generation Framework For High-Overlap Layouts

Computer Vision and Pattern Recognition 2025-03-04 v1

Abstract

Recent training-free layout-to-image diffusion models have demonstrated remarkable performance in generating high-quality images with controllable layouts. These models follow a one-stage framework: Encouraging the model to focus the attention map of each concept on its corresponding region by defining attention map-based losses. However, these models still struggle to accurately follow layouts with significant overlap, often leading to issues like attribute leakage and missing entities. In this paper, we propose ToLo, a two-stage, training-free layout-to-image generation framework for high-overlap layouts. Our framework consists of two stages: the aggregation stage and the separation stage, each with its own loss function based on the attention map. To provide a more effective evaluation, we partition the HRS dataset based on the Intersection over Union (IoU) of the input layouts, creating a new dataset for layout-to-image generation with varying levels of overlap. Through extensive experiments on this dataset, we demonstrate that ToLo significantly enhances the performance of existing methods when dealing with high-overlap layouts. Our code and dataset are available here: https://github.com/misaka12435/ToLo.

Keywords

Cite

@article{arxiv.2503.01667,
  title  = {ToLo: A Two-Stage, Training-Free Layout-To-Image Generation Framework For High-Overlap Layouts},
  author = {Linhao Huang and Jing Yu},
  journal= {arXiv preprint arXiv:2503.01667},
  year   = {2025}
}
R2 v1 2026-06-28T22:04:50.558Z