English

Threshold concentration for H blistering in defect free W

Materials Science 2015-05-27 v1

Abstract

Lattice distortion induced by high concentration of H is believed to be precursor of H blistering in single crystalline W (SCW) during H isotope irradiation. However, the critical H concentration needed to trigger bond-breaking of metal atoms presents a challenge to measure. Using density functional theory, we have calculated the formation energy of a vacancy and a self-interstitial atom (SIA) in supersaturated defect-free SCW with various H concentrations. When the ratio of H:W exceeds 1:2, the formation of both vacancies and self-interstitials becomes exothermic, meaning that spontaneous formation of micro-voids which can accommodate molecular H2 will occur. Molecular H2 is not allowed to form, and it is not needed either at the very initial stage of H blistering in SCW. With supersaturated H, the free volume at the vacancy or SIA is greatly smeared out with severe lattice distortion and more H can be trapped than in the dilute H case.

Keywords

Cite

@article{arxiv.1101.2939,
  title  = {Threshold concentration for H blistering in defect free W},
  author = {W. Xiao and G. -N. Luo and W. T. Geng},
  journal= {arXiv preprint arXiv:1101.2939},
  year   = {2015}
}

Comments

13 pages, 4 figures

R2 v1 2026-06-21T17:12:27.832Z