Thermoelastic study of nanolayered structures using time-resolved x-ray diffraction at high repetition rate

H. A. Navirian; D. Schick; P. Gaal; W. Leitenberger; R. Shayduk; M. Bargheer

doi:10.1063/1.4861873

Thermoelastic study of nanolayered structures using time-resolved x-ray diffraction at high repetition rate

Mesoscale and Nanoscale Physics 2015-06-16 v1 Materials Science

Authors: H. A. Navirian , D. Schick , P. Gaal , W. Leitenberger , R. Shayduk , M. Bargheer

View on arXiv ↗ PDF ↗ DOI ↗

Abstract

We investigate the thermoelastic response of a nanolayered sample composed of a metallic SrRuO3 (SRO) electrode sandwiched between a ferroelectric Pb(Zr0.2Ti0.8)O3 (PZT) film with negative thermal expansion and a SrTiO3 substrate. SRO is rapidly heated by fs-laser pulses with 208 kHz repetition rate. Diffraction of x-ray pulses derived from a synchrotron measures the transient out-of-plane lattice constant c of all three materials simultaneously from 120 ps to 5 mus with a relative accuracy up to Delta c/c = 10^-6. The in-plane propagation of sound is essential for understanding the delayed out of plane expansion.

Keywords

thin films ferroelectric thin film physics

Cite

@article{arxiv.1306.4165,
  title  = {Thermoelastic study of nanolayered structures using time-resolved x-ray diffraction at high repetition rate},
  author = {H. A. Navirian and D. Schick and P. Gaal and W. Leitenberger and R. Shayduk and M. Bargheer},
  journal= {arXiv preprint arXiv:1306.4165},
  year   = {2015}
}

Comments

5 pages, 3 figures

Thermoelastic study of nanolayered structures using time-resolved x-ray diffraction at high repetition rate

Abstract

Keywords

Cite

Comments

Related papers