Thermal x-ray diffraction and near-field phase contrast imaging
Optics
2018-02-15 v4 Quantum Physics
Abstract
Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. In this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs.
Cite
@article{arxiv.1606.03517,
title = {Thermal x-ray diffraction and near-field phase contrast imaging},
author = {Zheng Li and Anton Classen and Tao Peng and Nikita Medvedev and Fenglin Wang and Henry N. Chapman and Yanhua Shih},
journal= {arXiv preprint arXiv:1606.03517},
year = {2018}
}
Comments
10 pages, 4 figures