The study of the structure of viruses by X-ray free-electron lasers (XFEL) attracts more attention in recent decades. Such experiments are based on the collection of two-dimensional diffraction patterns measured at the detector after diffraction of femtosecond X-ray pulses on biological samples. In order to prepare the experiment at the European XFEL we simulated the diffraction data for the tick-borne encephalitis virus (TBEV) with different parameters and identified their optimal values. Following necessary steps of a well-established data processing pipeline, the structure of TBEV was obtained and the efficiency of the used methods was demonstrated.
@article{arxiv.2209.00339,
title = {The structure of Tick-borne Encephalitis virus determined at X-Ray Free-Electron Lasers. Simulations},
author = {Dameli Assalauova and Ivan A. Vartanyants},
journal= {arXiv preprint arXiv:2209.00339},
year = {2023}
}