The particle background of the X-IFU instrument

Simone Lotti; Teresa Mineo; Christian Jacquey; Silvano Molendi; Matteo D'Andrea; Claudio Macculi; Luigi Piro

doi:10.1007/s10686-017-9538-1

The particle background of the X-IFU instrument

Instrumentation and Methods for Astrophysics 2017-05-24 v1

Authors: Simone Lotti , Teresa Mineo , Christian Jacquey , Silvano Molendi , Matteo D'Andrea , Claudio Macculi , Luigi Piro

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Abstract

In this paper we are going to review the latest estimates for the particle background expected on the X-IFU instrument onboard of the ATHENA mission. The particle background is induced by two different particle populations: the so called "soft protons" and the Cosmic rays. The first component is composed of low energy particles (< 100s keV) that get funnelled by the mirrors towards the focal plane, losing part of their energy inside the filters and inducing background counts inside the instrument sensitivity band. The latter component is induced by high energy particles (> 100 MeV) that possess enough energy to cross the spacecraft and reach the detector from any direction, depositing a small fraction of their energy inside the instrument. Both these components are estimated using Monte Carlo simulations and the latest results are presented here.

Keywords

X-IFU instrument particle background ATHENA mission soft protons cosmic rays Monte Carlo simulations focal plane detector

Cite

@article{arxiv.1705.04076,
  title  = {The particle background of the X-IFU instrument},
  author = {Simone Lotti and Teresa Mineo and Christian Jacquey and Silvano Molendi and Matteo D'Andrea and Claudio Macculi and Luigi Piro},
  journal= {arXiv preprint arXiv:1705.04076},
  year   = {2017}
}

The particle background of the X-IFU instrument

Abstract

Keywords

Cite

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