Robotics · Computer Science
Fabric Defect Detection Using Vision-Based Tactile Sensor
Bin Fang, Xingming Long, Yifan Zhang, GuoYi Luo +2
2023-01-18
Image and Video Processing · Electrical Eng. & Systems
A High-Speed, Real-Time Vision System for Texture Tracking and Thread Counting
Yuting Hu, Zhiling Long, Ghassan AlRegib
2018-12-12
Computer Vision and Pattern Recognition · Computer Science
Automated Fabric Defect Inspection: A Survey of Classifiers
Md. Tarek Habib, Rahat Hossain Faisal, M. Rokonuzzaman, Farruk Ahmed
2014-05-26
Computer Vision and Pattern Recognition · Computer Science
Integrated Neural Network and Machine Vision Approach For Leather Defect Classification
Sze-Teng Liong, Y. S. Gan, Yen-Chang Huang, Kun-Hong Liu +1
2019-05-29
Computer Vision and Pattern Recognition · Computer Science
Automatic Defect Segmentation on Leather with Deep Learning
Sze-Teng Liong, Y. S. Gan, Yen-Chang Huang, Chang-Ann Yuan +1
2019-03-29
Computer Vision and Pattern Recognition · Computer Science
Automated Detection of Defects on Metal Surfaces using Vision Transformers
Toqa Alaa, Mostafa Kotb, Arwa Zakaria, Mariam Diab +1
2024-10-08
Computer Vision and Pattern Recognition · Computer Science
A Continual Learning Framework for Adaptive Defect Classification and Inspection
Wenbo Sun, Raed Al Kontar, Judy Jin, Tzyy-Shuh Chang
2023-07-04
Computer Vision and Pattern Recognition · Computer Science
Uneven illumination surface defects inspection based on convolutional neural network
Hao Wu, Yulong Liu, Wenbin Gao, Xiangrong Xu
2023-07-18
Soft Condensed Matter · Physics
Machine Eye for Defects: Machine Learning-Based Solution to Identify and Characterize Topological Defects in Textured Images of Nematic Materials
Haijie Ren, Weiqiang Wang, Wentao Tang, Rui Zhang
2025-01-20
Computer Vision and Pattern Recognition · Computer Science
One-Class Model for Fabric Defect Detection
Hao Zhou, Yixin Chen, David Troendle, Byunghyun Jang
2022-04-21
Image and Video Processing · Electrical Eng. & Systems
Learning graph-Fourier spectra of textured surface images for defect localization
Tapan Ganatma Nakkina, Adithyaa Karthikeyan, Yuhao Zhong, Ceyhun Eksin +1
2023-12-05