English

Testing Self-Reducible Samplers

Data Structures and Algorithms 2023-12-19 v1

Abstract

Samplers are the backbone of the implementations of any randomised algorithm. Unfortunately, obtaining an efficient algorithm to test the correctness of samplers is very hard to find. Recently, in a series of works, testers like Barbarik\mathsf{Barbarik}, Teq\mathsf{Teq}, Flash\mathsf{Flash} for testing of some particular kinds of samplers, like CNF-samplers and Horn-samplers, were obtained. But their techniques have a significant limitation because one can not expect to use their methods to test for other samplers, such as perfect matching samplers or samplers for sampling linear extensions in posets. In this paper, we present a new testing algorithm that works for such samplers and can estimate the distance of a new sampler from a known sampler (say, uniform sampler). Testing the identity of distributions is the heart of testing the correctness of samplers. This paper's main technical contribution is developing a new distance estimation algorithm for distributions over high-dimensional cubes using the recently proposed sub-cube conditioning sampling model. Given subcube conditioning access to an unknown distribution PP, and a known distribution QQ defined over {0,1}n\{0,1\}^n, our algorithm CubeProbeEst\mathsf{CubeProbeEst} estimates the variation distance between PP and QQ within additive error ζ\zeta using O(n2/ζ4)O\left({n^2}/{\zeta^4}\right) subcube conditional samples from PP. Following the testing-via-learning paradigm, we also get a tester which distinguishes between the cases when PP and QQ are ε\varepsilon-close or η\eta-far in variation distance with probability at least 0.990.99 using O(n2/(ηε)4)O({n^2}/{(\eta-\varepsilon)^4}) subcube conditional samples. The estimation algorithm in the sub-cube conditioning sampling model helps us to design the first tester for self-reducible samplers.

Keywords

Cite

@article{arxiv.2312.10999,
  title  = {Testing Self-Reducible Samplers},
  author = {Rishiraj Bhattacharyya and Sourav Chakraborty and Yash Pote and Uddalok Sarkar and Sayantan Sen},
  journal= {arXiv preprint arXiv:2312.10999},
  year   = {2023}
}

Comments

To be published in the 38th AAAI Conference on Artificial Intelligence (AAAI-24); Abstract shortened to meet with arxiv criteria

R2 v1 2026-06-28T13:54:20.778Z