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Terahertz Defect Detection in Multi-Layer Materials Using Echo Labeling

Signal Processing 2025-02-10 v2 Materials Science

Abstract

Non-destructive testing is an important technique for detecting defects in multi-layer materials, enabling the evaluation of structural integrity without causing damage on test materials. Terahertz time-domain spectroscopy (THz-TDS) offers unique capabilities for this purpose due to its sensitivity and resolution. Inspired by room geometry estimation methods in acoustic signal processing, this work proposes a novel approach for defect detection in multi-layer composite materials using THz-TDS, enhanced by high-power sources. The proposed method utilizes Euclidean distance matrices to reduce problem complexity compared to state-of-the-art approaches, and effectively distinguishes and maps higher-order reflections from sublayers, enabling precise defect localization in composite materials without artifacts.

Keywords

Cite

@article{arxiv.2502.04135,
  title  = {Terahertz Defect Detection in Multi-Layer Materials Using Echo Labeling},
  author = {Dogus Can Sevdiren and Furkan H. Ilgac and Aydin Sezgin},
  journal= {arXiv preprint arXiv:2502.04135},
  year   = {2025}
}

Comments

4 pages, 5 figures

R2 v1 2026-06-28T21:34:54.041Z