Temporal universal conductance fluctuations (TUCF) are observed in RuO2 nanowires at cryogenic temperatures. The fluctuations persist up to very high T∼10 K. Their root-mean-square magnitudes increase with decreasing T, reaching ∼0.2e2/h at T≲2 K. These fluctuations are shown to originate from scattering of conduction electrons with rich amounts of mobile defects in artificially synthesized metal oxide nanowires. TUCF characteristics in both one-dimensional saturated and unsaturated regimes are identified and explained in terms of current theories. Furthermore, the TUCF as a probe for the characteristic time scales of the mobile defects (two-level systems) are discussed.
@article{arxiv.1109.5848,
title = {Temporal universal conductance fluctuations in RuO$_2$ nanowires due to mobile defects},
author = {An-Shao Lien and L. Y. Wang and C. S. Chu and Juhn-Jong Lin},
journal= {arXiv preprint arXiv:1109.5848},
year = {2011}
}