Surface roughness interpretation of 730 kg days CRESST-II results

M. Kuźniak; M. G. Boulay; T. Pollmann

doi:10.1016/j.astropartphys.2012.05.005

Surface roughness interpretation of 730 kg days CRESST-II results

Instrumentation and Methods for Astrophysics 2012-08-20 v4 Cosmology and Nongalactic Astrophysics Instrumentation and Detectors

Authors: M. Kuźniak , M. G. Boulay , T. Pollmann

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Abstract

The analysis presented in the recent publication of the CRESST-II results finds a statistically significant excess of registered events over known background contributions in the acceptance region and attributes the excess to a possible Dark Matter signal, caused by scattering of relatively light WIMPs. We propose a mechanism which explains the excess events with ion sputtering caused by 206Pb recoils and alpha particles from 210Po decay, combined with realistic surface roughness effects.

Keywords

CRESST-II dark matter WIMP surface roughness ion sputtering

Cite

@article{arxiv.1203.1576,
  title  = {Surface roughness interpretation of 730 kg days CRESST-II results},
  author = {M. Kuźniak and M. G. Boulay and T. Pollmann},
  journal= {arXiv preprint arXiv:1203.1576},
  year   = {2012}
}

Comments

15 pages, 6 figures. v2: corrected quenching factor discussion. v3: corrected references. v4: added references

Surface roughness interpretation of 730 kg days CRESST-II results

Abstract

Keywords

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