English

Sub-wavelength imaging at optical frequencies using canalization regime

Materials Science 2015-06-25 v2

Abstract

Imaging with sub-wavelength resolution using a lens formed by periodic metal-dielectric layered structure is demonstrated. The lens operates in canalization regime as a transmission device and it does not involve negative refraction and amplification of evanescent modes. The thickness of the lens have to be an integer number of half-wavelengths and can be made as large as required for ceratin applications, in contrast to the other sub-wavelength lenses formed by metallic slabs which have to be much smaller than the wavelength. Resolution of λ/20\lambda/20 at 600 nm wavelength is confirmed by numerical simulation for a 300 nm thick structure formed by a periodic stack of 10 nm layers of glass with ϵ=2\epsilon=2 and 5 nm layers of metal-dielectric composite with ϵ=1\epsilon=-1. Resolution of λ/60\lambda/60 is predicted for a structure with same thickness, period and operating frequency, but formed by 7.76 nm layers of silicon with ϵ=15\epsilon=15 and 7.24 nm layers of silver with ϵ=14\epsilon=-14.

Keywords

Cite

@article{arxiv.cond-mat/0509522,
  title  = {Sub-wavelength imaging at optical frequencies using canalization regime},
  author = {Pavel A. Belov and Yang Hao},
  journal= {arXiv preprint arXiv:cond-mat/0509522},
  year   = {2015}
}

Comments

4 pages, 4 figures, submitted to PRL

R2 v1 2026-07-22T11:22:58.926Z