Sub-wavelength imaging at optical frequencies using canalization regime
Abstract
Imaging with sub-wavelength resolution using a lens formed by periodic metal-dielectric layered structure is demonstrated. The lens operates in canalization regime as a transmission device and it does not involve negative refraction and amplification of evanescent modes. The thickness of the lens have to be an integer number of half-wavelengths and can be made as large as required for ceratin applications, in contrast to the other sub-wavelength lenses formed by metallic slabs which have to be much smaller than the wavelength. Resolution of at 600 nm wavelength is confirmed by numerical simulation for a 300 nm thick structure formed by a periodic stack of 10 nm layers of glass with and 5 nm layers of metal-dielectric composite with . Resolution of is predicted for a structure with same thickness, period and operating frequency, but formed by 7.76 nm layers of silicon with and 7.24 nm layers of silver with .
Cite
@article{arxiv.cond-mat/0509522,
title = {Sub-wavelength imaging at optical frequencies using canalization regime},
author = {Pavel A. Belov and Yang Hao},
journal= {arXiv preprint arXiv:cond-mat/0509522},
year = {2015}
}
Comments
4 pages, 4 figures, submitted to PRL