Structural and dielectric characterization of Sm2MgMnO6

Moumin Rudra; Ritwik Maity; T. P. Sinha

Structural and dielectric characterization of Sm2MgMnO6

Materials Science 2017-07-03 v1

Authors: Moumin Rudra , Ritwik Maity , T. P. Sinha

Abstract

The polycrystalline Sm2MgMnO6 (SMMO) was synthesized at 1173K by means of sol-gel technique. Rietveld refine-ment of X-ray diffraction (XRD) pattern confirmed the formation of a single phase monoclinic structure with space group P21/n. The band gap achieved from UV-vis spectra shows the semiconducting nature of the material. To observe the effect of grains and grain-boundaries in the conduction process and dielectric relaxation measurements are carried out on SMMO sample at different frequencies between 313 K and 673 K. An electrical equivalent circuit consisting of the resistance and constant phase element is used to clarify the impedance data.

Keywords

sm2mgmmno6 sol-gel method x-ray diffraction band gap dielectric relaxation impedance analysis

Cite

@article{arxiv.1706.10038,
  title  = {Structural and dielectric characterization of Sm2MgMnO6},
  author = {Moumin Rudra and Ritwik Maity and T. P. Sinha},
  journal= {arXiv preprint arXiv:1706.10038},
  year   = {2017}
}

Comments

5 pages, 5 figures, 2 tables

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